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參數(shù)資料
| 型號(hào)： | ST72361AR9TC |
| 廠(chǎng)商： | STMICROELECTRONICS |
| 元件分類(lèi)： | 微控制器/微處理器 |
| 英文描述： | 8-BIT, FLASH, 8 MHz, MICROCONTROLLER, PQFP64 |
| 封裝： | 10 X 10 MM, ROHS COMPLIANT, PLASTIC, TQFP-64 |
| 文件頁(yè)數(shù)： | 103/224頁(yè) |
| 文件大?。?/td> | 4821K |
| 代理商： | ST72361AR9TC |
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ST72361-Auto
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EMC CHARACTERISTICS (Cont’d)
12.8.3 Absolute Maximum Ratings (Electrical
Sensitivity)
Based on three different tests (ESD, LU and DLU)
using specific measurement methods, the product
is stressed in order to determine its performance in
terms of electrical sensitivity (see Table 32 and
Table 33 below). For more details, refer to applica-
tion note AN1181.
12.8.3.1 Electro-Static Discharge (ESD)
Electro-Static Discharges (a positive then a nega-
tive pulse separated by 1 second) are applied to
the pins of each sample according to each pin
combination. The sample size depends on the
number of supply pins in the device (3 parts*(n+1)
supply pin). Two models can be simulated: Human
Body Model and Machine Model. This test con-
forms to the JESD22-A114A/A115A standard.
12.8.3.2 Static and Dynamic Latch-Up
■ LU: Three complementary static tests are
required on 10 parts to assess the latch-up
performance. A supply overvoltage (applied to
each power supply pin) and a current injection
(applied to each input, output and configurable I/
O pin) are performed on each sample. This test
conforms to the EIA/JESD 78 IC latch-up
standard. For more details, refer to application
note AN1181.
■ DLU: Electro-Static Discharges (one positive
then one negative test) are applied to each pin
of three samples when the micro is running to
assess the latch-up performance in dynamic
mode. Power supplies are set to the typical
values, the oscillator is connected as near as
possible to the pins of the micro and the
component is put in reset mode. This test
conforms to the IEC1000-4-2 and SAEJ1752/3
standards. For more details, refer to application
note AN1181.
Table 32. Absolute Maximum Ratings
Notes:
1. Data based on characterization results, not tested in production.
Table 33. Electrical Sensitivities
Notes:
1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-
ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the
JEDEC criteria (international standard).
Symbol
Ratings
Conditions
Maximum value1)
Unit
VESD(HBM) Electro-static discharge voltage (Human Body Model)
TA = +25°C
2000
V
VESD(MM)
Electro-static discharge voltage (Machine Model)
200
VESD(CDM) Electro-static discharge voltage (Charge Device Model)
750 on corner pins,
500 on others
Symbol
Parameter
Conditions
Class1)
LU
Static latch-up class
TA = +25°C
TA = +85°C
TA = +125°C
A
DLU
Dynamic latch-up class
VDD = 5.5V, fOSC = 4 MHz, TA = +25°C
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