參數(shù)資料
型號: PI7C8150ND
廠商: Pericom Semiconductor Corp.
英文描述: 2-Port PCI-to-PCI Bridge
中文描述: 2端口PCI至PCI橋
文件頁數(shù): 93/106頁
文件大?。?/td> 904K
代理商: PI7C8150ND
PI7C8150
2-PORT PCI-TO-PCI BRIDGE
ADVANCE INFORMATION
83
August 22, 2002 – Revision 1.02
The target reports any type of data parity errors during write cycles, while the master
reports data parity errors during read cycles.
Detection of an address parity error will cause the PCI-to-PCI Bridge target to not claim
the bus (P_DEVSEL_L remains inactive) and the cycle will then terminate with a Master
Abort. When the bridge is acting as master, a data parity error during a read cycle results in
the bridge master initiating a Master Abort.
15.2.4
SECONDARY IDSEL MAPPING
When PI7C8150 detects a Type 1 configuration transaction for a device connected to
the secondary, it translates the Type 1 transaction to Type 0 transaction on the downstream
interface. Type 1 configuration format uses a 5-bit field at P_AD[15:11] as a device
number. This is translated to S_AD[31:16] by PI7C8150.
16
IEEE 1149.1 COMPATIBLE JTAG CONTROLLER
An IEEE 1149.1 compatible Test Access Port (TAP) controller and associated TAP pins
are provided to support boundary scan in PI7C8150 for board-level continuity test and
diagnostics. The TAP pins assigned are TCK, TDI, TDO, TMS and TRST_L. All digital
input, output, input/output pins are tested except TAP pins.
The IEEE 1149.1 Test Logic consists of a TAP controller, an instruction register, and
a group of test data registers including Bypass and Boundary Scan registers. The TAP
controller is a synchronous 16-state machine driven by the Test Clock (TCK) and the Test
Mode Select (TMS) pins. An independent power on reset circuit is provided to ensure the
machine is in TEST_LOGIC_RESET state at power-up. The JTAG signal lines are not
active when the PCI resource is operating PCI bus cycles.
PI7C8150 implements 3 basic instructions: BYPASS, SAMPLE/PRELOAD, and
EXTEST.
16.1
BOUNDARY SCAN ARCHITECTURE
Boundary-scan test logic consists of a boundary-scan register and support logic. These are
accessed through a Test Access Port (TAP). The TAP provides a simple serial interface
that allows all processor signal pins to be driven and/or sampled, thereby providing direct
control and monitoring of processor pins at the system level.
This mode of operation is valuable for design debugging and fault diagnosis since it
permits examination of connections not normally accessible to the test system. The
following subsections describe the boundary-scan test logic elements: TAP pins,
instruction register, test data registers and TAP controller. Figure 16-1 illustrates how these
pieces fit together to form the JTAG unit.
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