參數資料
型號: MC68HC705JB2P
廠商: FREESCALE SEMICONDUCTOR INC
元件分類: 微控制器/微處理器
英文描述: 8-BIT, OTPROM, 3 MHz, MICROCONTROLLER, PDIP20
封裝: PLASTIC, DIP-20
文件頁數: 12/128頁
文件大?。?/td> 2493K
代理商: MC68HC705JB2P
August 28, 1998
GENERAL RELEASE SPECIFICATION
INSTRUCTION SET
REV 1.1
12-5
12.1.11 Read-Modify-Write Instructions
These instructions read a memory location or a register, modify its contents, and
write the modied value back to the memory location or to the register. The test for
negative or zero instruction (TST) is an exception to the read-modify-write
sequence because it does not write a replacement value. Table 12-2 lists the
read-modify-write instructions.
12.1.12 Jump/Branch Instructions
Jump instructions allow the CPU to interrupt the normal sequence of the program
counter. The unconditional jump instruction (JMP) and the jump to subroutine
instruction (JSR) have no register operand. Branch instructions allow the CPU to
interrupt the normal sequence of the program counter when a test condition is
met. If the test condition is not met, the branch is not performed. All branch
instructions use relative addressing.
Bit test and branch instructions cause a branch based on the state of any
readable bit in the rst 256 memory locations. These three-byte instructions use a
combination of direct addressing and relative addressing. The direct address of
the byte to be tested is in the byte following the opcode. The third byte is the
signed offset byte. The CPU nds the conditional branch destination by adding the
Table 12-2. Read-Modify-Write Instructions
Instruction
Mnemonic
Arithmetic Shift Left
ASL
Arithmetic Shift Right
ASR
Clear Bit in Memory
BCLR
Set Bit in Memory
BSET
Clear
CLR
Complement (One’s Complement)
COM
Decrement
DEC
Increment
INC
Logical Shift Left
LSL
Logical Shift Right
LSR
Negate (Two’s Complement)
NEG
Rotate Left through Carry Bit
ROL
Rotate Right through Carry Bit
ROR
Test for Negative or Zero
TST
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For More Information On This Product,
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