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DS05-10177-2E
FUJITSU SEMICONDUCTOR
DATA SHEET
MEMORY
CMOS 4 M
FAST PAGE MODE DYNAMIC RAM
×
1 BIT
MB814100C-60/-70
CMOS 4,194,304
×
1 bit Fast Page Mode Dynamic RAM
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DESCRIPTION
The Fujitsu MB814100C is a fully decoded CMOS Dynamic RAM (DRAM) that contains a total of 4,194,304
memory cells in a
×
1 configuration. The MB814100C features a ”fast page” mode of operation whereby high-
speed random access of up to 2,048-bits of data within the same row can be selected. The MB814100C DRAM
is ideally suited for mainframe, buffers, hand-held computers video imaging equipment, and other memory
applications where very low power dissipation and high bandwidth are basic requirements of the design. Since
the standby current of the MB814100C is very small, the device can be used as a non-volatile memory in
equipment that uses batteries for primary and/or auxiliary power.
The MB814100C is fabricated using silicon gate CMOS and Fujitsu’s advanced four-layer polysilicon process.
This process, coupled with advanced stacked capacitor memory cells, reduces the possibility of soft errors and
extends the time interval between memory refreshes. Clock timing requirements for the MB814100C are not
critical and all inputs are TTL compatible.
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PRODUCT LINE & FEATURES
Parameter
MB814100C-60
MB814100C-70
RAS Access Time
60 ns max.
70 ns max.
CAS Access Time
15 ns max.
20 ns max.
Address Access Time
30 ns max.
35 ns max.
Randam Cycle Time
110 ns min.
125 ns min.
Fast Page Mode Cycle Time
40 ns min.
45 ns min.
Low power Dissipation
Operating current
336 mW max.
297 mW max.
Standby current
11 mW max. (TTL level)/5.5 mW max. (CMOS level)
This device contains circuitry to protect the inputs against damage due to high static voltages or electric fields. However, it is advised that
normal precautions be taken to avoid application of any voltage higher than maximum rated voltages to this high impedance circuit.
4,194,304 words
×
1 bit organization
Silicon gate, CMOS, Advanced-Stacked Capacitor
Cell
All input and output areTTL compatible
1024 refresh cycles every 16.4 ms
Common I/O capability by using early write
RAS only CAS-before-RAS, or Hidden Refresh
Fast page Mode, Read-Modify-Write capability
On chip substrate bias generator for high perfor-
mance