
MCF5227x ColdFire Microprocessor Data Sheet, Rev. 8
Electrical Characteristics
Freescale Semiconductor
18
5.3
ESD Protection
5.4
DC Electrical Specifications
Table 9. ESD Protection Characteristics1,2
1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade
Integrated Circuits.
2 A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification requirements. Complete DC parametric and functional testing is performed per
applicable device specification at room temperature followed by hot temperature, unless specified
otherwise in the device specification.
Characteristic
Symbol
Value
Unit
ESD Target for Human Body Model
HBM
2000
V
Table 10. DC Electrical Specifications
Characteristic
Symbol
Min
Max
Unit
Core Supply Voltage
IVDD
1.4
1.6
V
PLL Supply Voltage
PLLVDD
1.4
1.6
V
RTC Supply Voltage
RTCVDD
1.4
1.6
V
CMOS Pad Supply Voltage
EVDD
3.0
3.6
V
SDRAM and FlexBus Supply Voltage
Mobile DDR/Bus Pad Supply Voltage (nominal 1.8V)
DDR/Bus Pad Supply Voltage (nominal 2.5V)
SDR/Bus Pad Supply Voltage (nominal 3.3V)
SDVDD
1.7
2.25
3.0
1.95
2.75
3.6
V
USB Supply Voltage
USBVDD
3.0
3.6
V
Oscillator Supply Voltage
OSCVDD
3.0
3.6
V
CMOS Input High Voltage
EVIH
2EVDD +0.3
V
CMOS Input Low Voltage
EVIL
VSS – 0.3
0.8
V
CMOS Output High Voltage
IOH = –5.0 mA
EVOH
EVDD – 0.4
—
V
CMOS Output Low Voltage
IOL = 5.0 mA
EVOL
—0.4
V
SDRAM and FlexBus Input High Voltage
Mobile DDR/Bus Input High Voltage (nominal 1.8V)
DDR/Bus Pad Supply Voltage (nominal 2.5V)
SDR/Bus Pad Supply Voltage (nominal 3.3V)
SDVIH
1.35
1.7
2
SDVDD +0.3
V
SDRAM and FlexBus Input Low Voltage
Mobile DDR/Bus Input High Voltage (nominal 1.8V)
DDR/Bus Pad Supply Voltage (nominal 2.5V)
SDR/Bus Pad Supply Voltage (nominal 3.3V)
SDVIL
VSS – 0.3
0.45
0.8
V