Revision 13 2-51 Voltage-Referenced I/O Characteristics 3.3 V GTL Gunning Transceiver Logic is a high-speed bu" />
參數(shù)資料
型號: M1AGLE3000V2-FGG896I
廠商: Microsemi SoC
文件頁數(shù): 129/166頁
文件大?。?/td> 0K
描述: IC FPGA 1KB FLASH 3M 896-FBGA
標(biāo)準(zhǔn)包裝: 27
系列: IGLOOe
邏輯元件/單元數(shù): 75264
RAM 位總計: 516096
輸入/輸出數(shù): 620
門數(shù): 3000000
電源電壓: 1.14 V ~ 1.575 V
安裝類型: 表面貼裝
工作溫度: -40°C ~ 85°C
封裝/外殼: 896-BGA
供應(yīng)商設(shè)備封裝: 896-FBGA(31x31)
IGLOOe Low Power Flash FPGAs
Revision 13
2-51
Voltage-Referenced I/O Characteristics
3.3 V GTL
Gunning Transceiver Logic is a high-speed bus standard (JESD8-3). It provides a differential amplifier
input buffer and an open-drain output buffer. The VCCI pin should be connected to 3.3 V.
Table 2-73 Minimum and Maximum DC Input and Output Levels
3.3 V GTL
VIL
VIH
VOL
VOH IOL IOH
IOSL
IOSH
IIL1 IIH2
Drive
Strength
Min.
V
Max.
V
Min.
V
Max.
V
Max
V
Min.
VmA mA
Max.
mA3
Max.
mA3
A4 A4
20 mA5
–0.3
VREF – 0.05
VREF + 0.05
3.6
0.4
20 20
268
181
10 10
Notes:
1. IIL is the input leakage current per I/O pin over recommended operating conditions where –0.3 V < VIN < VIL.
2. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is
larger when operating outside recommended ranges.
3. Currents are measured at high temperature (100°C junction temperature) and maximum voltage.
4. Currents are measured at 85°C junction temperature.
5. Output drive strength is below JEDEC specification.
Figure 2-13 AC Loading
Table 2-74 AC Waveforms, Measuring Points, and Capacitive Loads
Input Low (V)
Input High (V) Measuring Point* (V)
VREF (typ.) (V)
VTT (typ.) (V)
CLOAD (pF)
VREF – 0.05
VREF + 0.05
0.8
1.2
10
Note: *Measuring point = Vtrip. See Table 2-23 on page 2-23 for a complete table of trip points.
Test Point
10 pF
25
GTL
VTT
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