參數(shù)資料
型號(hào): LH28F160S3NS-L13
英文描述: EEPROM|FLASH|1MX16/2MX8|CMOS|SOP|56PIN|PLASTIC
中文描述: 的EEPROM | FLASH動(dòng)畫| 1MX16/2MX8 |的CMOS |??苵 56PIN |塑料
文件頁(yè)數(shù): 36/56頁(yè)
文件大?。?/td> 373K
代理商: LH28F160S3NS-L13
LH28F160S5-L/S5H-L
- 36 -
TEST CONFIGURATION
V
CC
= 5.0±0.25 V
(NOTE 1)
V
CC
= 5.0±0.5 V
NOTE :
1.
Applied to high-speed products, LH28F160S5-L70 and
LH28F160S5H-L70.
CL (pF)
30
100
Test Configuration Capacitance Loading Value
Fig. 12 Transient Input/Output Reference Waveform for V
CC
= 5.0±0.25 V
(High Speed Testing Configuration)
1.5
1.5
3.0
0.0
TEST POINTS
INPUT
OUTPUT
6.2.2 AC INPUT/OUTPUT TEST CONDITIONS
AC test inputs are driven at 3.0 V for a Logic "1" and 0.0 V for a Logic "0". Input timing begins, and output
timing ends, at 1.5 V. Input rise and fall times (10% to 90%) < 10 ns.
Fig. 13 Transient Input/Output Reference Waveform for V
CC
= 5.0±0.5 V
(Standard Testing Configuration)
2.0
0.8
2.0
0.8
2.4
0.45
TEST POINTS
INPUT
OUTPUT
AC test inputs are driven at V
OH
(2.4 V
TTL
) for a Logic "1" and V
OL
(0.45 V
TTL
) for a Logic "0". Input timing
begins at V
IH
(2.0 V
TTL
) and V
IL
(0.8 V
TTL
). Output timing ends at V
IH
and V
IL
. Input rise and fall times (10%
to 90%) < 10 ns.
Fig. 14 Transient Equivalent Testing
Load Circuit
DEVICE
UNDER
TEST
C
L
Includes Jig
Capacitance
R
L
= 3.3 k
C
L
OUT
1.3 V
1N914
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
LH28F160S3R-L10 制造商:SHARP 制造商全稱:Sharp Electrionic Components 功能描述:16-MBIT(2MBx8/1MBx16) Smart 3 Flash MEMORY
LH28F160S3R-L13 制造商:未知廠家 制造商全稱:未知廠家 功能描述:EEPROM|FLASH|1MX16/2MX8|CMOS|TSSOP|56PIN|PLASTIC
LH28F160S3T-L10 制造商:SHARP 制造商全稱:Sharp Electrionic Components 功能描述:Flash Memory 16M (2MB 】 8/1MB 】 16)
LH28F160S3T-L10A 功能描述:IC FLASH 16MBIT 100NS 56TSOP RoHS:否 類別:集成電路 (IC) >> 存儲(chǔ)器 系列:- 標(biāo)準(zhǔn)包裝:96 系列:- 格式 - 存儲(chǔ)器:閃存 存儲(chǔ)器類型:FLASH 存儲(chǔ)容量:1M (64K x 16) 速度:150ns 接口:并聯(lián) 電源電壓:3 V ~ 3.6 V 工作溫度:0°C ~ 70°C 封裝/外殼:48-TFSOP(0.724",18.40mm 寬) 供應(yīng)商設(shè)備封裝:48-TSOP 包裝:托盤
LH28F160S3T-L13 制造商:未知廠家 制造商全稱:未知廠家 功能描述:x8/x16 Flash EEPROM