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參數(shù)資料
| 型號(hào)： | IBM04364ARLAD-5N |
| 元件分類： | SRAM |
| 英文描述： | 128K X 36 STANDARD SRAM, 5.5 ns, PBGA119 |
| 封裝： | BGA-119 |
| 文件頁數(shù)： | 21/22頁 |
| 文件大?。?/td> | 517K |
| 代理商： | IBM04364ARLAD-5N |
IBM04184ARLAD
IBM04364ARLAD
128K x 36 & 256K x 18 SRAM
Preliminary
IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 8 of 22
75H4338
Revised 2/99
AC Test Conditions (T
A=0 to +85°C, VDD = 3.3V ±5%, VDDQ =2.5V -5%/+10%)
Parameter
Symbol
Conditions
Units
Notes
Input High Level
VIH
2.25
V
Input High Level
VIH(1CADVKH)
2.0
Input Low Level
VIL
0.25
V
Input Low Level
VIL(1CADVKH)
0.8
V
PECL Clock Input High Voltage
VIH-PECL
2.4
V
PECL Clock Input Low Voltage
VIL-PECL
1.5
V
Input Rise Time
TR
1.0
ns
Input Fall Time
TF
1.0
ns
PECL Clock Input Rise Time
TR-PECL
0.5
ns
PECL Clock Input Fall Time
TF-PECL
0.5
ns
Input and Output Timing Reference Level (except K,K)
1.25
V
PECL Clock Reference Level
K and K Cross Point
V
Output Load Conditions
1. VIH,VIL for Data Ins, Addresses and Controls when their Set Up Time is > or = 1 ns.(Verified by design)
AC Test Loading
DQ
1.25V
50
50
16.7
16.7
5pF
1.25V
50
50
16.7
5pF
1.25V
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