參數(shù)資料
型號: DSP56858VF120
廠商: 飛思卡爾半導體(中國)有限公司
英文描述: 16-bit Digital Signal Controllers
中文描述: 16位數(shù)字信號控制器
文件頁數(shù): 21/64頁
文件大?。?/td> 956K
代理商: DSP56858VF120
Introduction
56858 Technical Data, Rev. 6
Freescale Semiconductor
21
TCK
L8
60
Input
Test Clock Input (TCK)
—This input pin provides a gated clock to
synchronize the test logic and to shift serial data to the JTAG/OnCE
port. The pin is connected internally to a pull-down resistor.
TDI
K7
58
Input
Test Data Input (TDI)
—This input pin provides a serial input data
stream to the JTAG/OnCE port. It is sampled on the rising edge of
TCK and has an on-chip pull-up resistor.
TDO
G6
57
Output(Z)
Test Data Output (TDO)
—This tri-statable output pin provides a serial
output data stream from the JTAG/Enhanced OnCE port. It is driven in
the Shift-IR and Shift-DR controller states, and changes on the falling
edge of TCK.
TMS
J7
59
Input
Test Mode Select Input (TMS)
—This input pin is used to sequence
the JTAG TAP controller’s state machine. It is sampled on the rising
edge of TCK and has an on-chip pull-up resistor.
Note:
Always tie the TMS pin to V
DD
through a 2.2K resistor.
TRST
L7
56
Input
Test Reset (TRST)
—As an input, a low signal on this pin provides a
reset signal to the JTAG TAP controller. To ensure complete hardware
reset, TRST should be asserted whenever RESET is asserted. The
only exception occurs in a debugging environment, since the
Enhanced OnCE/JTAG module is under the control of the debugger. In
this case it is not necessary to assert TRST when asserting RESET.
Outside of a debugging environment RESET should be permanently
asserted by grounding the signal, thus disabling the Enhanced
OnCE/JTAG module on the device.
Note:
to be used in a debugging environment, TRST may be tied to V
SS
through a
1K resistor.
For normal operation, connect TRST directly to V
SS
. If the design is
Table 3-1 56858 Signal and Package Information for the 144-pin LQFP and MAPBGA
Signal
Name
BGA
Pin No.
LQFP
Pin No.
Type
Description
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