參數(shù)資料
型號(hào)： DSP56311VL150R2
廠商： Freescale Semiconductor
文件頁數(shù)： 11/96頁
文件大?。?/td> 0K
描述： IC DSP 24BIT 150MHZ 196-MAPBGA
標(biāo)準(zhǔn)包裝： 1
系列： DSP56K/Symphony
類型： 定點(diǎn)
接口： 主機(jī)接口，SSI，SCI
時(shí)鐘速率： 150MHz
非易失內(nèi)存： ROM（576 B）
芯片上RAM： 384kB
電壓 - 輸入/輸出： 3.30V
電壓 - 核心： 1.80V
工作溫度： -40°C ~ 100°C
安裝類型： 表面貼裝
封裝/外殼： 196-LBGA
供應(yīng)商設(shè)備封裝： 196-MAPBGA（15x15）
包裝： 剪切帶 (CT)
其它名稱： DSP56311VL150R2CT
JTAG and OnCE Interface
DSP56311 Technical Data, Rev. 8
Freescale Semiconductor
1-15
1.12 JTAG and OnCE Interface
The DSP56300 family and in particular the DSP56311 support circuit-board test strategies based on the IEEE
Std. 1149.1 test access port and boundary scan architecture, the industry standard developed under the
sponsorship of the Test Technology Committee of IEEE and the JTAG. The OnCE module provides a means to
interface nonintrusively with the DSP56300 core and its peripherals so that you can examine registers, memory, or
on-chip peripherals. Functions of the OnCE module are provided through the JTAG TAP signals. For programming
models, see the chapter on debugging support in the DSP56300 Family Manual.
Table 1-16.
JTAG/OnCE Interface
Signal
Name
Type
State During
Reset
Signal Description
TCK
Input
Test Clock—A test clock input signal to synchronize the JTAG test logic.
TDI
Input
Test Data Input—A test data serial input signal for test instructions and data.
TDI is sampled on the rising edge of TCK and has an internal pull-up resistor.
TDO
Output
Tri-stated
Test Data Output—A test data serial output signal for test instructions and
data. TDO is actively driven in the shift-IR and shift-DR controller states. TDO
changes on the falling edge of TCK.
TMS
Input
Test Mode Select—Sequences the test controller’s state machine. TMS is
sampled on the rising edge of TCK and has an internal pull-up resistor.
TRST
Input
Test Reset—Initializes the test controller asynchronously. TRST has an
internal pull-up resistor. TRST must be asserted during and after power-up
(see EB610/D for details).
DE
Input/ Output
Input
Debug Event—As an input, initiates Debug mode from an external command
controller, and, as an open-drain output, acknowledges that the chip has
entered Debug mode. As an input, DE causes the DSP56300 core to finish
executing the current instruction, save the instruction pipeline information,
enter Debug mode, and wait for commands to be entered from the debug
serial input line. This signal is asserted as an output for three clock cycles
when the chip enters Debug mode as a result of a debug request or as a result
of meeting a breakpoint condition. The DE has an internal pull-up resistor.
This signal is not a standard part of the JTAG TAP controller. The signal
connects directly to the OnCE module to initiate debug mode directly or to
provide a direct external indication that the chip has entered Debug mode. All
other interface with the OnCE module must occur through the JTAG port.
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