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| 型號： | ADM1027ARQZ-RL7 |
| 廠商： | ON Semiconductor |
| 文件頁數(shù)： | 14/56頁 |
| 文件大?。?/td> | 1822K |
| 描述： | IC REMOTE THERMAL CTLR 24QSOP |
| 產(chǎn)品變化通告： | MFG CHG Notification ADI to ON Semi Product Discontinuation Notice 25/Aug/2008 Product Obsolescence 30/Sept/2009 |
| 標(biāo)準(zhǔn)包裝： | 1,000 |
| 系列： | dBCool® |
| 功能： | 風(fēng)扇控制，溫度監(jiān)控器 |
| 傳感器類型： | 內(nèi)部和外部 |
| 感應(yīng)溫度： | 0°C ~ 105°C，外部傳感器 |
| 精確度： | ±1°C |
| 拓撲： | ADC，比較器，風(fēng)扇速度計數(shù)器，多路復(fù)用器，寄存器庫 |
| 輸出類型： | SMBus? |
| 輸出警報： | 無 |
| 輸出風(fēng)扇： | 是 |
| 電源電壓： | 3 V ~ 5.5 V |
| 工作溫度： | 0°C ~ 105°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 24-SSOP（0.154"，3.90mm 寬） |
| 供應(yīng)商設(shè)備封裝： | 24-QSOP |
| 包裝： | 帶卷 (TR) |
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REV. A
14
ADM1027
TEMPERATURE MEASUREMENT SYSTEM
Local Temperature Measurement
The ADM1027 contains an on-chip band gap temperature
sensor whose output is digitized by the on-chip 10-bit ADC.
The 8-bit MSB temperature data is stored in the local temp
register (Address 0x26). As both positive and negative tempera-
tures can be measured, the temperature data is stored in twos
complement format, as shown in Table III. Theoretically, the
temperature sensor and ADC can measure temperatures from
128
o
C to +127
o
C with a resolution of 0.25
o
C. However, this
exceeds the operating temperature range of the device (0
o
C to
105
o
C), so local temperature measurements outside this range
are not possible. Temperature measurement from 127
o
C to
+127
o
C is possible using a remote sensor.
Remote Temperature Measurement
The ADM1027 can measure the temperature of two remote
diode sensors or diode-connected transistors connected to
Pins 15 and 16, or 17 and 18.
The forward voltage of a diode or diode-connected transistor,
operated at a constant current, exhibits a negative temperature
coefficient of about 2 mV/
o
C. Unfortunately, the absolute
value of V
be
varies from device to device, and individual calibra-
tion is required to null this out, so the technique is unsuitable
for mass production. The technique used in the ADM1027 is to
measure the change in V
be
when the device is operated at two
different currents. This is given by
where:
K is Boltzmanns constant.
q is charge on the carrier.
T is absolute temperature in kelvins.
N is the ratio of the two currents.
Figure 13 shows the input signal conditioning used to measure
the output of a remote temperature sensor. This figure shows the
external sensor as a substrate transistor, provided for temperature
monitoring on some microprocessors. It could equally well be a
discrete transistor such as a 2N3904/06.
D+
D
REMOTE
SENSING
TRANSISTOR
I
N I
I
BIAS
V
DD
V
OUT+
TO ADC
V
OUT
BIAS
DIODE
LOW-PASS
FILTER
f
C
= 65kHz
THERMDA
THERMDC
CPU
Figure 13. Signal Conditioning for Remote Diode Temperature Sensors
DV
KT q
N
be
=
?/DIV>
( )
ln
Rev. 3 | Page 14 of 56 | www.onsemi.com
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