
REV. 0
–5–
AD9887
Test
AD9887KS
Parameter
Conditions
Level
Min
Typ
Max
Unit
AC SPECIFICATIONS (continued)
High-to-Low Transition Time for DATACK (DHLT)
Output Drive = High; CL =10 pF
IV
1.4
ns
Output Drive = Med; CL = 7 pF
IV
1.7
ns
Output Drive = Low; CL = 5 pF
IV
2.1
ns
Clock to Data Skew, tSKEW
IV
–0.5
+2.0
ns
Duty Cycle, tDCYCLE
IV
45
55
% of
Period
High
DATACK Frequency (FCIP) (1 Pixel/Clock)
VI
20
112
MHz
DATACK Frequency (FCIP) (2 Pixels/Clock)
IV
10
56
MHz
NOTES
1The typical pattern contains a gray scale area, Output Drive = High.
2The worst-case pattern contains a black and white checkerboard pattern, Output Drive = High.
3The setup and hold times with respect to the DATACK rising edge are the same as the falling edge.
41 Pixel/clock mode, DATACK and
DATACK Load = 10 pF, Data Load = 5 pF.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the AD9887 features proprietary ESD protection circuitry, permanent damage may occur on
devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
ABSOLUTE MAXIMUM RATINGS*
VD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.6 V
VDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.6 V
Analog Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . VD to 0.0 V
VREF IN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VD to 0.0 V
Digital Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 V to 0.0 V
Digital Output Current . . . . . . . . . . . . . . . . . . . . . . . . 20 mA
Operating Temperature . . . . . . . . . . . . . . . . . –25
°C to +85°C
Storage Temperature . . . . . . . . . . . . . . . . . . –65
°C to +150°C
Maximum Junction Temperature . . . . . . . . . . . . . . . . 150
°C
Maximum Case Temperature . . . . . . . . . . . . . . . . . . . 150
°C
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions outside of those indicated in the operation
sections of this specication is not implied. Exposure to absolute maximum ratings
for extended periods may affect device reliability.
EXPLANATION OF TEST LEVELS
Test Level
Explanation
I
100% production tested.
II
100% production tested at 25
°C and sample
tested at specied temperatures.
III
Sample tested only.
IV
Parameter is guaranteed by design and charac-
terization testing.
V
Parameter is a typical value only.
VI
100% production tested at 25
°C; guaranteed
by design and characterization testing.
ORDERING GUIDE
Temperature
Package
Model
Range
Description
Option
AD9887KS-140
0
°C to 70°C
Plastic Quad Flatpack
S-160
AD9887KS-100
0
°C to 70°C
Plastic Quad Flatpack
S-160
AD9887/PCB
25
°C
Evaluation Board
OBSOLETE