參數(shù)資料
型號: 2MBI75U4A-120
廠商: FUJI ELECTRIC CO LTD
元件分類: IGBT 晶體管
英文描述: 100 A, 1200 V, N-CHANNEL IGBT
封裝: MODULE-7
文件頁數(shù): 10/13頁
文件大?。?/td> 416K
代理商: 2MBI75U4A-120
H04-004-03a
6
MS5F6060
13
a
11. Reliability test results
Reliability Test Items
Test
cate-
gories
Test items
Test methods and conditions
Reference
norms
EIAJ ED-4701
(Aug.-2001 edition)
Number
of
sample
Accept-
ance
number
1 Terminal Strength
Pull force
: 40N
Test Method 401
5
( 0 : 1 )
(Pull test)
Test time
: 10±1 sec.
MethodⅠ
2 Mounting Strength
Screw torque
: 2.5 ~ 3.5 Nm (M5)
Test Method 402
5
( 0 : 1 )
Test time
: 10±1 sec.
methodⅡ
3 Vibration
Range of frequency : 10 ~ 500Hz
Test Method 403
5
( 0 : 1 )
Sweeping time
: 15 min.
Reference 1
Acceleration
: 100m/s2
Condition code B
Sweeping direction : Each X,Y,Z axis
Test time
: 6 hr. (2hr./direction)
4 Shock
Maximum acceleration : 5000m/s2
Test Method 404
5
( 0 : 1 )
Pulse width
: 1.0msec.
Condition code B
Direction
: Each X,Y,Z axis
Test time
: 3 times/direction
1 High Temperature
Storage temp.
: 125±5 ℃
Test Method 201
5
( 0 : 1 )
Storage
Test duration
: 1000hr.
2 Low Temperature
Storage temp.
: -40±5 ℃
Test Method 202
5
( 0 : 1 )
Storage
Test duration
: 1000hr.
3 Temperature
Storage temp.
: 85±2 ℃
Test Method 103
5
( 0 : 1 )
Humidity
Relative humidity
: 85±5%
Test code C
Storage
Test duration
: 1000hr.
4 Unsaturated
Test temp.
: 120±2 ℃
Test Method 103
5
( 0 : 1 )
Pressurized Vapor Test humidity
: 85±5%
Test code E
Test duration
: 96hr.
5 Temperature
Test Method 105
5
( 0 : 1 )
Cycle
Test temp.
:
Low temp. -40±5 ℃
High temp. 125 ±5 ℃
RT
5 ~ 35 ℃
Dwell time
: High ~ RT ~ Low ~ RT
1hr. 0.5hr. 1hr. 0.5hr.
Number of cycles
: 100 cycles
6 Thermal Shock
+0
Test Method 307
5
( 0 : 1 )
Test temp.
:
High temp. 100
-5
method Ⅰ
+5
Condition code A
Low temp.
0
-0
Used liquid : Water with ice and boiling water
Dipping time
: 5 min. par each temp.
Transfer time
: 10 sec.
Number of cycles
: 10 cycles
M
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a
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