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參數(shù)資料
| 型號： | TC94A23F |
| 廠商： | Toshiba Corporation |
| 英文描述： | Single-chip CD Processor with Built-in Controller |
| 中文描述： | 單芯片的CD處理器的控制器，內(nèi)置 |
| 文件頁數(shù)： | 17/20頁 |
| 文件大小： | 219K |
| 代理商： | TC94A23F |
TC94A23F
2002-02-06
17
A/D converter
(ADin1 to ADin4)
Characteristic
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
Analog input voltage range
V
AD
ADin1~ADin4
0
~
MV
DD
V
Resolution
VRES
6
bit
Total conversion error
0.5
1.0
LSB
Analog input leakage
I
LI
V
IH
5.0 V, V
IL
0 V (ADin1~ADin4)
1.0
A
DOUT, SBSY, SBOK, SEL, OT19/
HSO
, OT20/SPCK, OT21/SPDA, OT22/COFS output
Characteristic
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
High level
I
OH4
V
OH
4.5 V
1.5
4.0
Output current
Low level
I
OL4
V
OL
0.5 V
1.5
4.0
mA
PDO, TMAX, RFGC, TEBC, FMO, DMO, TRO, FOO output
Characteristic
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
High level
I
OH6
V
OH
3.8 V, P2V
REF
4.2 V (PDO, TMAX)
2.0
Output current
Low level
I
OL4
V
OL
0.5 V, P2V
REF
4.2 V (PDO, TMAX)
6.0
mA
Output resistance
R
out3
(RFGC, TEBC, FMO, DMO, TRO, FOO)
3.3
k
V
REF
output voltage
V
oref
(RFGC, TEBC, FMO, DMO, PDD)
V
REF
PV
REF
2.1 V
2.1
V
Transfer delay time
(AOUT, SPDA, DATA, SBSY, SBOK)
Characteristic
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
High level
t
pLH
10
Transfer delay
time
Low level
t
pHL
10
ns
1-bit DA converter
Characteristic
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
Total harmony distortion
THD N
1 kHz sine wave, full-scale input
85
78
S/N ratio
S/N
90
98
Dynamic range
DR
1 kHz sine wave, based on 60dB input
85
90
Crosstalk
CT
1 kHz sine wave, full-scale input
90
85
dB
Analog output level
DAC
out
1 kHz sine wave, full-scale input
1200
1250
1300
mVrms
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