951
32072H–AVR32–10/2012
AT32UC3A3
Starting in Run-Test/Idle, SAB data is accessed in the following way:
1.
Select the IR Scan path.
2.
In Capture-IR: The IR output value is latched into the shift register.
3.
In Shift-IR: The instruction register is shifted by the TCK input.
4.
Return to Run-Test/Idle.
5.
Select the DR Scan path.
6.
In Shift-DR: Scan in the direction bit (1=read, 0=write), 2-bit access size, and the 36-bit
address of the data to access.
7.
Go to Update-DR and re-enter Select-DR Scan.
8.
In Shift-DR: For a read operation, scan out the contents of the addressed area. For a
write operation, scan in the new contents of the area.
9.
Return to Run-Test/Idle.
For any operation, the full 36 bits of the address must be provided. For write operations, 32 data
bits must be provided, or the result will be undefined. For read operations, shifting may be termi-
nated once the required number of bits have been acquired.
Table 35-18. Size Field Semantics
Size field value
Access size
Data alignment
00
Byte (8 bits)
Address modulo 4 : data alignment
0: dddddddd xxxxxxxx xxxxxxxx xxxxxxxx
1: xxxxxxxx dddddddd xxxxxxxx xxxxxxxx
2: xxxxxxxx xxxxxxxx dddddddd xxxxxxxx
3: xxxxxxxx xxxxxxxx xxxxxxxx dddddddd
01
Halfword (16 bits)
Address modulo 4 : data alignment
0: dddddddd dddddddd xxxxxxxx xxxxxxxx
1: Not allowed
2: xxxxxxxx xxxxxxxx dddddddd dddddddd
3: Not allowed
10
Word (32 bits)
Address modulo 4 : data alignment
0: dddddddd dddddddd dddddddd dddddddd
1: Not allowed
2: Not allowed
3: Not allowed
11
Reserved
N/A
Table 35-19. MEMORY_SIZED_ACCESS Details
Instructions
Details
IR input value
10101 (0x15)
IR output value
peb01
DR Size
39 bits
DR input value (Address phase)
aaaaaaaa aaaaaaaa aaaaaaaa aaaaaaaa aaaassr
DR input value (Data read phase)
xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxx
DR input value (Data write phase)
dddddddd dddddddd dddddddd dddddddd xxxxxxx