參數(shù)資料
型號(hào): NTE2102
廠商: NTE Electronics, Inc.
英文描述: Integrated Circuit NMOS, 1K Static RAM (SRAM), 350ns
中文描述: 集成電路NMOS管,每1000靜態(tài)RAM(SRAM),350ns
文件頁(yè)數(shù): 1/3頁(yè)
文件大?。?/td> 28K
代理商: NTE2102
NTE2102
Integrated Circuit
NMOS, 1K Static RAM (SRAM), 350ns
Description:
The NTE2101 is a high–speed 1024 x 1 bit static random access read/write memory in a 16–Lead
DIP type package designed using N–Channel depletion mode silicon gate technology. Static storage
cells eliminate the need for clock or refresh circuitry.
Low threshold silicon gate N–Channel technology allows complete DTL/TTL compatibility of all inputs
and outputs as well as a single 5V supply. The separate chip enable input (CE) controlling the output
allows easy memory expansion by OR–tying individual devices to a data bus. Data in and data out
have the same polarity.
Features:
Single 5V Supply
All Inputs and Outputs Directly DTL/TTL Compatible
Static Operation – No Clocks or Refresh
All Inputs Protected Against Static Charge
350ns Access Time
Absolute Maximum Ratings:
(Note 1)
Voltage at Any Pin
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Power Dissipation, P
D
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage Temperature Range, T
stg
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead Temperature (During Soldering, 10sec), T
L
Note 1. “Absolute Maximum Ratings” are those values beyond which the device may be permanently
damaged. They do not mean the device may be operated at these values.
0.5V to +7V
1W
–65
°
to +150
°
C
+300
°
C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Recommended Operating Conditions:
Parameter
Supply Voltage
Operating Ambient Temperature
Input Low Voltage
Input High Voltage
Symbol
V
CC
T
A
V
IL
V
IH
Test Conditions
Min
4.75
0
–0.5
2.0
Typ
Max
5.25
+70
0.8
V
CC
Unit
V
°
C
V
V
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