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參數(shù)資料
| 型號： | MAX1304ECM/V+T |
| 廠商： | Maxim Integrated Products |
| 文件頁數(shù)： | 34/37頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC ADC 12BIT 4000KSPS 8CH 48LQFP |
| 產(chǎn)品培訓模塊： | Lead (SnPb) Finish for COTS Obsolescence Mitigation Program |
| 標準包裝： | 2,000 |
| 位數(shù)： | 12 |
| 采樣率（每秒）： | 3.65M |
| 數(shù)據(jù)接口： | 并聯(lián) |
| 轉(zhuǎn)換器數(shù)目： | 1 |
| 功率耗散（最大）： | 1.82W |
| 電壓電源： | 模擬和數(shù)字 |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 48-LQFP |
| 供應(yīng)商設(shè)備封裝： | 48-LQFP（7x7） |
| 包裝： | 帶卷 (TR) |
| 輸入數(shù)目和類型： | 8 個單端，單極 |
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MAX1304–MAX1306/MAX1308–MAX1310/MAX1312–MAX1314
8-/4-/2-Channel, 12-Bit, Simultaneous-Sampling ADCs
with ±10V, ±5V, and 0 to +5V Analog Input Ranges
6
_______________________________________________________________________________________
Note 1: For the MAX1304/MAX1305/MAX1306, VIN = 0 to +5V. For the MAX1308/MAX1309/MAX1310, VIN = -5V to +5V. For the
MAX1312/MAX1313/MAX1314, VIN = -10V to +10V.
Note 2: All channel performance is guaranteed by correlation to a single channel test.
Note 3: The analog input resistance is terminated to an internal bias point (Figure 5). Calculate the analog input current using:
for VCH_ within the input voltage range.
Note 4: Throughput rate is given per channel. Throughput rate is a function of clock frequency (fCLK). The external clock through-
put rate is specified with fCLK = 16.67MHz and the internal clock throughput rate is specified with fCLK = 15MHz. See the
Data Throughput section for more information.
Note 5: The REF input resistance is terminated to an internal +2.5V bias point (Figure 2). Calculate the REF input current using:
for VREF within the input voltage range.
Note 6: The REFMS input resistance is terminated to an internal +2.5V bias point (Figure 2). Calculate the REFMS input current using:
for VREFMS within the input voltage range.
Note 7: All analog inputs are driven with a -0.4dBFS 500kHz sine wave.
Note 8: Shutdown current is measured with the analog input unconnected. The large amplitude of the maximum shutdown current
specification is due to automated test equipment limitations.
Note 9: CONVST must remain low for at least the acquisition period. The maximum acquisition time is limited by internal capacitor droop.
Note 10: CS to WR and CS to RD are internally AND together. Setup and hold times do not apply.
Note 11: Minimum CLK frequency is limited only by the internal T/H droop rate. Limit the time between the rising edge of CONVST
and the falling edge of EOLC to a maximum of 1ms.
I
VV
R
REFMS
=
25
.
I
VV
R
REF
=
25
.
I
VV
R
CH
BIAS
CH
_
=
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
Input-Data Setup Time
tDTW
Figure 6
10
ns
Input-Data Hold Time
tWTD
Figure 6
10
ns
External CLK Period
tCLK
Figures 8, 9
0.05
10.00
s
External CLK High Period
tCLKH
Logic sensitive to rising edges,
Figures 8, 9
20
ns
External CLK Low Period
tCLKL
Logic sensitive to rising edges,
Figures 8, 9
20
ns
External Clock Frequency
fCLK
(Note 11)
0.1
20
MHz
Internal Clock Frequency
fINT
15
MHz
CONVST High to CLK Edge
tCNTC
Figures 8, 9
20
ns
ELECTRICAL CHARACTERISTICS (continued)
(VAVDD = +5V, VDVDD = +3V, VAGND = VDGND = 0V, VREF = VREFMS = +2.5V (external reference), CREF = CREFMS = 0.1F, CREF+ =
CREF- = 0.1F, CREF+-to-REF- = 2.2F || 0.1F, CCOM = 2.2F || 0.1F, CMSV = 2.2F || 0.1F (unipolar devices), MSV = AGND (bipo-
lar devices), fCLK = 16.67MHz 50% duty cycle, INTCLK/EXTCLK = AGND (external clock), SHDN = DGND, TA = TMIN to TMAX,
unless otherwise noted. Typical values are at TA = +25°C. See Figures 3 and 4.)
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