參數(shù)資料
型號: MAS31753FXXXX
廠商: DYNEX SEMICONDUCTOR LTD
元件分類: DMA控制器
英文描述: 4 CHANNEL(S), 16 MHz, DMA CONTROLLER, CQFP84
封裝: QFP-84
文件頁數(shù): 22/31頁
文件大?。?/td> 238K
代理商: MAS31753FXXXX
MA31753
29/31
RADIATION TOLERANCE
Total Dose Radiation Testing
For product procured to total dose radiation levels, each
wafer lot will be approved when all sample devices pass the
total dose radiation test.
The sample devices will be subjected to the total dose
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
Dynex Semiconductor can provide radiation testing
compliant with MIL STD 883 test method 1019, Ionizing
Radiation (Total Dose).
Total Dose (Function to specification)*
3x10
5 Rad(Si)
Transient Upset (Stored data loss)
1x10
11 Rad(Si)/sec
Transient Upset (Survivability)
>1x10
12 Rad(Si)/sec
Neutron Hardness (Function to specification)
>1x10
15 n/cm2
Single Event Upset**
<1x10
-10 Errors/bit day
Latch Up
Not possible
* Other total dose radiation levels available on request
** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Figure 24: Radiation Hardness Parameters
相關(guān)PDF資料
PDF描述
MAR28155CXXXX 24 I/O, PIA-GENERAL PURPOSE, CDIP40
MAR28155LXXXX 24 I/O, PIA-GENERAL PURPOSE, CQCC44
MAS28155CXXXX 24 I/O, PIA-GENERAL PURPOSE, CDIP40
MAH28155LXXXX 24 I/O, PIA-GENERAL PURPOSE, CQCC44
MAX3100ETG+ 1 CHANNEL(S), 230.4K bps, SERIAL COMM CONTROLLER, QCC24
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