參數(shù)資料
型號(hào)： L64767
廠商： LSI CORP
元件分類： 消費(fèi)家電
英文描述： SMATV（Satellite Master Antenna Television） QAM Encoder(衛(wèi)星主天線電視正交振幅調(diào)制編碼器)
中文描述： SPECIALTY CONSUMER CIRCUIT, PQFP100
封裝： MQUAD-100
文件頁(yè)數(shù)： 15/32頁(yè)
文件大?。?/td> 298K
代理商： L64767
L64767 SMATV QAM Encoder
15
Test Signals
The eight signals described below control functions such as chip-level,
full scan tests, JTAG tests, and internal RAM tests. Five pins (TCK, TDI,
TDO, TMS, and TRST) are used for JTAG tests. The other three pins are
for SCAN_ENABLE, SCAN_MODE, and T_N (test output enable). Note
that the L64767 is in normal functional mode when SCAN_ENABLE,
SCAN_MODE, TCK, TDI, TMS, T_N, and TRST are left unconnected.
SCAN_ENABLE
Scan Enable
This is a level-sensitive data signal with a pull-down
resistor. When HIGH, this signal enables scan chain shift.
In default normal operation, SCAN_ENABLE is LOW.
Input
SCAN_MODE Scan Mode
Input
This is a level-sensitive signal with a pull-down resistor.
When this signal is HIGH, the chip is switched to scan
test mode. In default normal operation, SCAN_MODE is
LOW.
TCK
Test Mode Clock
When HIGH, this is a rising or falling edge signal for the
JTAG test mode clock. In default normal operational
mode, TCK is LOW.
Input
TDI
Test Data Input
When HIGH, this level-sensitive signal provides JTAG
data input. In default normal operational mode, TDI is
LOW.
Input
TDO
Test Data
This is the JTAG data output.
Output
TMS
Test Mode Select
When HIGH, this level-sensitive signal enables the JTAG
test mode. In default normal operational mode, TMS is
LOW.
Input
T_N
Test Output Enable
This is an active LOW signal with a pull-up resistor that
disables the test mode when T_N is LOW. It switches all
3-stated buffers to high-impedance mode for test or
device selection on a common bus. In default normal
operation, T_N is HIGH.
Input
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