參數(shù)資料
型號(hào): KFH1G16Q2M-DID5
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: FLASH MEMORY(54MHz)
中文描述: 閃存(54MHz之間)
文件頁(yè)數(shù): 76/93頁(yè)
文件大?。?/td> 1219K
代理商: KFH1G16Q2M-DID5
OneNAND512/OneNAND1GDDP
FLASH MEMORY
76
DC CHARACTERISTICS
NOTES:
1.
CE should be V
IH
for RDY. IOBE should be ’0’ for INT
2. I
CC
active for Host access
3. I
CC
active while Internal operation is in progress
Parameter
Sym-
bol
Test Conditions
1.8V device
2.65V device
3.3V device
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Input Leakage Current
I
LI
V
IN
=V
SS
to V
CC
, V
CC
=V
CCmax
- 1.0
-
+ 1.0
- 1.0
-
+ 1.0
- 1.0
-
+ 1.0
μ
A
Output Leakage Cur-
rent
I
LO
V
OUT
=V
SS
to V
CC
, V
CC
=V
CCmax
, CE or OE=V
IH
(Note 1)
- 1.0
-
+ 1.0
- 1.0
-
+ 1.0
- 1.0
-
+ 1.0
μ
A
Active Asynchronous
Read Current (Note 2)
I
CC1
CE=V
IL
, OE=V
IH
-
8
15
-
10
20
-
10
20
mA
Active Burst Read
Current (Note 2)
I
CC2
CE=V
IL
, OE=V
IH
54MHz
-
12
20
-
20
30
-
20
30
mA
1MHz
-
3
4
-
4
6
-
4
6
mA
Active Write Current
(Note 2)
I
CC3
CE=V
IL
, OE=V
IH
-
8
15
-
10
20
-
10
20
mA
Active Load Current
(Note 3)
I
CC4
CE=V
IL
, OE=V
IH
, WE=V
IH
,
V
IN
=V
IH
or
V
IL
-
20
25
-
25
30
-
25
30
mA
Active Program Cur-
rent (Note 3)
I
CC5
CE=V
IL
, OE=V
IH
, WE=V
IH
,
V
IN
=V
IH
or
V
IL
-
20
25
-
25
30
-
25
30
mA
Active Erase Current
(Note3)
I
CC6
CE=V
IL
, OE=V
IH
, WE=V
IH
,
V
IN
=V
IH
or
V
IL
-
15
20
-
20
25
-
20
25
mA
Standby Current
I
SB
CE= RP=V
CC
±
0.2V
Single
-
10
50
-
20
50
-
20
50
μ
A
DDP
-
20
100
-
40
100
-
40
100
Input Low Voltage
V
IL
-
-0.5
-
0.4
-0.5
-
0.4
0
-
0.8
V
Input High Voltage
V
IH
-
V
CCIO
-0.4
-
V
CCIO
+0.4
V
CCIO
-0.4
-
V
CCIO
+0.4
0.7*
V
CCIO
-
0.7*
V
CCIO
V
Output Low Voltage
V
OL
I
OL
= 100
μ
A , V
CC
=V
CCmin
,
V
CCq
=V
CCqmin
-
-
0.2
-
-
0.2
-
-
0.22*
V
CCIO
V
Output High Voltage
V
OH
I
OH
= -100
μ
A , V
CC
=V
CCmin
,
V
CCq
=V
CCqmin
V
CCIO
-0.1
-
-
V
CCIO
-0.4
-
-
0.8*V
CCIO
-
-
V
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