| 型號 | 廠商 | 描述 |
| sn54lvth16952wd 2 3 4 5 6 7 8 9 10 11 12 13 |
Texas Instruments, Inc. | Octal 3-State Inverting Buffer/Line Driver/Line Receiver; Package: SOIC-20 WB; No of Pins: 20; Container: Tape and Reel; Qty per Container: 1000 |
| sn74lvth16952dgg 2 3 4 5 6 7 8 9 10 11 12 13 |
Texas Instruments, Inc. | Ceramic Chip Capacitors / MIL-PRF-55681; Capacitance [nom]: 0.018uF; Working Voltage (Vdc)[max]: 50V; Capacitance Tolerance: +/-10%; Dielectric: Multilayer Ceramic; Temperature Coefficient: X7R (BX); Lead Style: Surface Mount Chip; Lead Dimensions: 1206; Termination: 100% Tin (Sn); Body Dimensions: 0.125" x 0.062" x 0.051"; Container: Bag; Features: MIL-PRF-55681: S Failure Rate |
| sn54lvth182245 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 掃描檢測裝置帶18位總線收發(fā)器) |
| sn54lvth18245 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 掃描檢測裝置帶18位總線收發(fā)器) |
| sn74lvth182245 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 掃描檢測裝置帶18位總線收發(fā)器) |
| sn74lvth18245 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 掃描檢測裝置帶18位總線收發(fā)器) |
| sn54lvth182504ahv 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Octal 3-State Inverting Buffer/Line Driver/Line Receiver; Package: SOEIAJ-20; No of Pins: 20; Container: Rail; Qty per Container: 40 |
| sn54lvth18504ahv 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: SOIC-20 WB; No of Pins: 20; Container: Tape and Reel; Qty per Container: 1000 |
| sn54lvth182504a 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT掃描測試裝置(20位通用總線收發(fā)器)) |
| sn54lvth18504a 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT掃描測試裝置(20位通用總線收發(fā)器)) |
| sn54lvth182646ahv 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: TSSOP 20 LEAD; No of Pins: 20; Container: Rail; Qty per Container: 75 |
| sn54lvth18646ahv 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: SOEIAJ-20; No of Pins: 20; Container: Tape and Reel; Qty per Container: 2000 |
| sn54lvth182652ahv 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: TSSOP 20 LEAD; No of Pins: 20; Container: Tape and Reel; Qty per Container: 2500 |
| sn54lvth18652ahv 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: 20 LEAD PDIP; No of Pins: 20; Container: Rail; Qty per Container: 18 |
| sn54lvth18512 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT掃描測試裝置(18位通用總線收發(fā)器)) |
| sn54lvth182512 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT掃描測試裝置(18位通用總線收發(fā)器)) |
| sn54lvth18514 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT掃描測試裝置(20位通用總線收發(fā)器)) |
| sn54lvth182514 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT掃描測試裝置(20位通用總線收發(fā)器)) |
| sn74lvth182514 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3V ABT掃描測試裝置(20位通用總線收發(fā)器)) |
| sn54lvth18516 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT掃描測試裝置(18位通用總線收發(fā)器)) |
| sn74lvth18516 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT掃描測試裝置(18位通用總線收發(fā)器)) |
| sn54lvth182516 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT掃描測試裝置(18位通用總線收發(fā)器)) |
| sn74lvth182516 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT掃描測試裝置(18位通用總線收發(fā)器)) |
| sn54lvth18640 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 掃描檢測裝置(18位反相總線收發(fā)器)) |
| sn54lvth182640 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 掃描檢測裝置(18位反相總線收發(fā)器)) |
| sn74lvth182640 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 掃描檢測裝置(18位反相總線收發(fā)器)) |
| sn74lvth18640 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 掃描檢測裝置(18位反相總線收發(fā)器)) |
| sn54lvth18646a 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 掃描檢測裝置(18位收發(fā)器和寄存器)) |
| sn54lvth182646a 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 掃描檢測裝置(18位收發(fā)器和寄存器)) |
| sn54lvth18652a 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 掃描檢測裝置(18位收發(fā)器和寄存器)) |
| sn54lvth182652a 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 掃描檢測裝置(18位收發(fā)器和寄存器)) |
| sn54lvth2245 2 3 4 5 6 7 |
Texas Instruments, Inc. | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: 20 LEAD PDIP; No of Pins: 20; Container: Rail; Qty per Container: 18 |
| sn54lvth2245j 2 3 4 5 6 7 |
Texas Instruments, Inc. | Octal 3-State Non-Inverting Transparent Latch; Package: TSSOP 20 LEAD; No of Pins: 20; Container: Rail; Qty per Container: 75 |
| sn54lvth2245w 2 3 4 5 6 7 |
Texas Instruments, Inc. | Octal 3-State Non-Inverting Transparent Latch; Package: TSSOP 20 LEAD; No of Pins: 20; Container: Tape and Reel; Qty per Container: 2500 |
| sn74lvth2245db 2 3 4 5 6 7 |
Texas Instruments, Inc. | 3.3-V ABT OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
| sn54lvth2245fk 2 3 4 5 6 7 |
Texas Instruments, Inc. | Octal 3-State Non-Inverting Transparent Latch; Package: TSSOP 20 LEAD; No of Pins: 20; Container: Rail; Qty per Container: 75 |
| sn54lvth245 2 3 4 5 6 7 |
Texas Instruments, Inc. | 3.3V ABT Octal Bus Transceivers and Registers With 3-State Outputs(3.3V ABT八總線收發(fā)器(三態(tài)輸出)) |
| sn54lvth374fk 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 |
Texas Instruments, Inc. | 8/Bit Shift Register; Package: SOIC 16 LEAD; No of Pins: 16; Container: Tape and Reel; Qty per Container: 2500 |
| sn54lvth374j 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 |
Texas Instruments, Inc. | 8/Bit Shift Register; Package: SOIC 16 LEAD; No of Pins: 16; Container: Tape and Reel; Qty per Container: 2500 |
| sn54lvth374w 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 |
Texas Instruments, Inc. | 8/Bit Shift Register; Package: TSSOP-16; No of Pins: 16; Container: Tape and Reel; Qty per Container: 2500 |
| sn74lvth374db 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 |
Texas Instruments, Inc. | 3.3-V ABT OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS |
| sn54lvth540 2 3 4 5 6 7 |
Texas Instruments, Inc. | Octal Buffers/Drivers With 3-State Outputs(八緩沖器/驅(qū)動器(三態(tài)輸出)) |
| sn54lvth541 2 3 4 5 6 7 |
Texas Instruments, Inc. | Octal Buffers/Drivers With 3-State Outputs(八緩沖器/驅(qū)動器(三態(tài)輸出)) |
| sn54lvth573fk 2 3 4 5 6 7 |
Texas Instruments, Inc. | Shift Register 3-State; Package: TSSOP-16; No of Pins: 16; Container: Tape and Reel; Qty per Container: 2500 |
| sn54lvth573j 2 3 4 5 6 7 |
Texas Instruments, Inc. | 3.3-V ABT OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS |
| sn54lvth573w 2 3 4 5 6 7 |
Texas Instruments, Inc. | Shift Register 3-State; Package: SOEIAJ-16; No of Pins: 16; Container: Tape and Reel; Qty per Container: 2000 |
| sn74lvth573db 2 3 4 5 6 7 |
Texas Instruments, Inc. | 3.3-V ABT OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS |
| sn74lvth573gqnr 2 3 4 5 6 7 |
Texas Instruments, Inc. | 3.3V ABT OCTAL TRANSPARENT D TYPE LATCHES WITH 3 STATE OUTPUTS |
| sn74lvth573zqnr 2 3 4 5 6 7 |
Texas Instruments, Inc. | 3.3V ABT OCTAL TRANSPARENT D TYPE LATCHES WITH 3 STATE OUTPUTS |
| sn54lvth574fk 2 3 4 5 6 7 |
Texas Instruments, Inc. | Shift Register 3-State; Package: PDIP-16; No of Pins: 16; Qty per Container: 500 |