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參數(shù)資料
| 型號： | SN54LVTH16952WD |
| 廠商： | Texas Instruments, Inc. |
| 元件分類： | 通用總線功能 |
| 英文描述： | Octal 3-State Inverting Buffer/Line Driver/Line Receiver; Package: SOIC-20 WB; No of Pins: 20; Container: Tape and Reel; Qty per Container: 1000 |
| 中文描述： | 的3.3V ABT生根粉16位收發(fā)登記，3態(tài)輸出 |
| 文件頁數(shù)： | 1/13頁 |
| 文件大?。?/td> | 211K |
| 代理商： | SN54LVTH16952WD |
SN54LVTH16952, SN74LVTH16952
3.3-V ABT 16-BIT REGISTERED TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCBS697G – JULY 1997 – REVISED APRIL 2000
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Members of the Texas Instruments
Widebus
Family
State-of-the-Art Advanced BiCMOS
Technology (ABT) Design for 3.3-V
Operation and Low Static-Power
Dissipation
Support Mixed-Mode Signal Operation (5-V
Input and Output Voltages With 3.3-V V
CC
)
Support Unregulated Battery Operation
Down to 2.7 V
Typical V
OLP
(Output Ground Bounce)
<0.8 V at V
CC
= 3.3 V, T
A
= 25
°
C
I
off
and Power-Up 3-State Support Hot
Insertion
Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
Distributed V
CC
and GND Pins Minimize
High-Speed Switching Noise
Flow-Through Architecture Optimizes PCB
Layout
Latch-Up Performance Exceeds 500 mA Per
JESD 17
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
Package Options Include Plastic Shrink
Small-Outline (DL) and Thin Shrink
Small-Outline (DGG) Packages and 380-mil
Fine-Pitch Ceramic Flat (WD) Package
description
The ’LVTH16952 devices are 16-bit registered transceivers designed for low-voltage (3.3-V) V
CC
operation, but
with the capability to provide a TTL interface to a 5-V system environment.
These devices can be used as two 8-bit transceivers or one 16-bit transceiver. Data on the A or B bus is stored
in the registers on the low-to-high transition of the clock (CLKAB or CLKBA) input, provided that the clock-enable
(CLKENAB or CLKENBA) input is low. Taking the output-enable (OEAB or OEBA) input low accesses the data
on either port.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
When V
CC
is between 0 and 1.5 V, the devices are in the high-impedance state during power up or power down.
However, to ensure the high-impedance state above 1.5 V, OE should be tied to V
CC
through a pullup resistor;
the minimum value of the resistor is determined by the current-sinking capability of the driver.
Copyright
2000, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus is a trademark of Texas Instruments.
SN54LVTH16952 . . . WD PACKAGE
SN74LVTH16952 . . . DGG OR DL PACKAGE
(TOP VIEW)
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1OEAB
1CLKAB
1CLKENAB
GND
1A1
1A2
V
CC
1A3
1A4
1A5
GND
1A6
1A7
1A8
2A1
2A2
2A3
GND
2A4
2A5
2A6
V
CC
2A7
2A8
GND
2CLKENAB
2CLKAB
2OEAB
1OEBA
1CLKBA
1CLKENBA
GND
1B1
1B2
V
CC
1B3
1B4
1B5
GND
1B6
1B7
1B8
2B1
2B2
2B3
GND
2B4
2B5
2B6
V
CC
2B7
2B8
GND
2CLKENBA
2CLKBA
2OEBA
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN74LVTH16952DGG | Ceramic Chip Capacitors / MIL-PRF-55681; Capacitance [nom]: 0.018uF; Working Voltage (Vdc)[max]: 50V; Capacitance Tolerance: +/-10%; Dielectric: Multilayer Ceramic; Temperature Coefficient: X7R (BX); Lead Style: Surface Mount Chip; Lead Dimensions: 1206; Termination: 100% Tin (Sn); Body Dimensions: 0.125" x 0.062" x 0.051"; Container: Bag; Features: MIL-PRF-55681: S Failure Rate |
| SN54LVTH182245 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 掃描檢測裝置帶18位總線收發(fā)器) |
| SN54LVTH18245 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 掃描檢測裝置帶18位總線收發(fā)器) |
| SN74LVTH182245 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 掃描檢測裝置帶18位總線收發(fā)器) |
| SN74LVTH18245 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 掃描檢測裝置帶18位總線收發(fā)器) |
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