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參數(shù)資料
| 型號： | DAC8143 |
| 廠商： | Analog Devices, Inc. |
| 英文描述： | 12-Bit Serial Daisy-Chain CMOS D/A Converter(12位串行菊花鏈D/A轉(zhuǎn)換器) |
| 中文描述： | 12位串行菊花鏈的CMOS D / A轉(zhuǎn)換（12位串行菊花鏈的D / A轉(zhuǎn)換器） |
| 文件頁數(shù)： | 4/16頁 |
| 文件大小： | 319K |
| 代理商： | DAC8143 |
DAC8143
–4–
REV. B
1. I
OUT1
2. I
OUT2
3. AGND
4. STB
1
5. LD
1
6. SR0
7. SRI
8. STB
2
1
9. LD
2
10. STB
3
11. STB
4
12. DGND
13. CLR
14. V
DD
(SUBSTRATE)
15. V
REF
16. R
FB
SUBSTRATE (DIE BACKSIDE) IS INTERNALLY CONNECTED TO V
DD
.
FOR ADDITIONAL DICE INFORMATION, REFER TO 1990/91 DATA-
BOOK, SECTION 2.
DICE CHARACT E RIST ICS
DIE SIZE 0.099 x 0.107 inch, 10,543 sq. mils
(2.51 x 2.72 mm, 6.83 sq. mm)
DAC8143G
Limits
Parameter
Symbol
Conditions
Units
ST AT IC ACCURACY
Resolution
Integral Nonlinearity
Differential Nonlinearity
Gain Error
Power Supply Rejection Ratio
Output Leakage Current (I
OUT 1
)
N
INL
DNL
G
FSE
PSRR
I
LK G
12
±
1
±
1
±
2
±
0.002
±
5
Bits min
LSB max
LSB max
LSB max
%/% max
nA max
Using Internal Feedback Resistor
V
DD
= fl5%
Digital Inputs = V
IL
REFERENCE INPUT
Input Resistance
DIGIT AL INPUT S/OUT PUT
Digital Input HIGH
Digital Input LOW
Input Leakage Current
Digital Output HIGH
Digital Output LOW
POWER SUPPLY
Supply Current
R
IN
V
REF
pad
7/15
k
min/max
V
IH
V
IL
I
IL
V
OH
V
OL
2.4
0.8
±
1
4
0.4
V min
V max
μ
A max
V min
V max
V
IN
= 0 V to V
DD
I
OH
= –200
μ
A
I
OL
= 1.6 mA
I
DD
Digital Inputs = V
IH
or V
IL
Digital Inputs = 0 V or V
DD
2.0
0.1
mA max
mA max
NOT E
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.
WAFER TEST LIMTS
at V
DD
= +5 V; V
REF
= +10 V; V
OUT1
= V
OUT2
= V
AGND
= V
DGND
= 0 V, T
A
= +25
8
C.
WARNING!
ESD SENSITIVE DEVICE
C AUT ION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the DAC8143 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. T herefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
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