參數(shù)資料
型號: CY7C439
廠商: Cypress Semiconductor Corp.
英文描述: Bidirectional 2K x 9 FIFO( 2K x 9雙向 先進先出)
中文描述: 雙向2K × 9的FIFO(2K × 9雙向先進先出)
文件頁數(shù): 3/17頁
文件大?。?/td> 282K
代理商: CY7C439
CY7C439
3
Electrical Characteristics
Over the Operating Range
[2]
7C439-25
Min.
2.4
7C439-30
Min.
2.4
7C439-40
Min.
2.4
7C439-65
Min.
2.4
Parameter
V
OH
Description
Output HIGH
Voltage
Test Conditions
V
CC
= Min.,
I
OH
= -2.0 mA
V
CC
= Min., I
OL
= 8.0 mA
Max.
Max.
Max.
Max.
Unit
V
V
OL
Output LOW
Voltage
0.4
0.4
0.4
0.4
V
V
IH
Input HIGH
Voltage
Com’l
2.2
V
CC
2.2
V
CC
V
CC
0.8
2.2
V
CC
V
CC
0.8
2.2
V
CC
V
CC
0.8
V
Mil
2.2
3.0
2.2
3.0
2.2
3.0
V
V
V
IL
Input LOW
Voltage
3.0
0.8
I
IX
Input Leakage
Current
GND < V
I
< V
CC
10
+10
10
+10
10
+10
10
+10
μ
A
I
OZ
Output Leakage
Current
Operating Current
STBX > V
IH
,
GND < V
O
< V
CC
V
CC
= Max.,
I
OUT
= 0 mA
10
+10
10
+10
10
+10
10
+10
μ
A
I
CC
Com’l
[3]
Mil
[4]
147
140
130
115
mA
170
160
145
I
SB1
Standby Current
All Inputs =
V
IH
Min.
Com’l
Mil
40
40
45
40
45
40
45
mA
I
SB2
Power-Down
Current
All Inputs
V
CC
- 0.2V
Com’l
20
20
20
20
mA
Mil
25
90
25
90
25
90
I
OS
Output Short
Circuit Current
[5]
V
CC
= Max., V
OUT
= GND
90
mA
Capacitance
[6]
Parameter
Description
Test Conditions
T
A
= 25
°
C, f = 1 MHz,
V
CC
= 4.5V
Max.
8
10
Unit
pF
pF
C
IN
C
OUT
Notes:
2.
3.
Input Capacitance
Output Capacitance
See the last page of this specification for Group A subgroup testing information.
I
(commercial) = 115 mA + [(f - 12.5) 2 mA/MHz] for
f > 12.5 MHz
where f = the larger of the write or read
operating frequency.
I
(military) = 145 mA + [(f - 12.5) 2 mA/MHz] for
f > 12.5 MHz
where f = the larger of the write or read
operating frequency.
For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
Tested initially and after any design or process changes that may affect these parameters.
4.
5.
6.
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