參數(shù)資料
型號(hào)： AN2897
英文描述： Using the eTPU Angle Clock
中文描述： 使用時(shí)鐘角的eTPU
文件頁(yè)數(shù)： 24/32頁(yè)
文件大?。?/td> 587K
代理商： AN2897
Using the eTPU Angle Clock, Rev. 0
eTPU Software Design
Freescale Semiconductor
24
{
Last_State = Apparent_Gap;
}
else
{
Last_State = Testing_Possible_Gap;
/* if the test fails, we continue testing... */
}
break;
4.2.5
Apparent Gap
When the gap test is satisfied it may be necessary to confirm the fact by testing the period of the following
gap.
4.2.6
Possible Gap Verifying
One possible means to verify a probable gap is to determine that the period following appears to be shorter
by a test similar to the one used to find the gap. The algorithm and parameters used for gap detection and
verification must satisfy the requirements for the target system. If the gap is not verified, the system must
return to the Testing for a Possible Gap state.
EXAMPLE
case Apparent_Gap:
ToothPeriodLast = ToothPeriod;
ToothPeriod= TempToothPeriod;
ToothTime = EdgeCaptureTime;
ToothCount = ToothCount + 1;
if (ToothPeriod >= ToothPeriodLast*GapRatio)//verify
{
CrankStatus = Half_Sync;
SetChannelInterrupt();//Inform the host that the crank status is
updated
ToothCount = 1;
/* More */
Last_State = GapVerified;
}
else
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