Table 4. ELECTRICAL CHARACTERISTICS (TA
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      參數(shù)資料
      型號(hào): ADM1024EVB
      廠商: ON Semiconductor
      文件頁數(shù): 26/30頁
      文件大?。?/td> 0K
      描述: BOARD EVAL FOR ADM1024
      標(biāo)準(zhǔn)包裝: 1
      其它名稱: EVAL-ADM1024EB
      EVAL-ADM1024EB-ND
      ADM1024
      http://onsemi.com
      5
      Table 4. ELECTRICAL CHARACTERISTICS (TA = TMIN to TMAX, VCC = VMIN to VMAX, unless otherwise noted. (Note 1 and 2))
      Parameter
      Unit
      Max
      Typ
      Min
      Test Conditions/Comments
      OPEN-DRAIN SERIAL DATABUS OUTPUT (SDA)
      Output Low Voltage, VOL
      IOUT = 3.0 mA, VCC = 2.85 V 3.60 V
      0.4
      V
      High Level Output Leakage Current, IOH
      VOUT = VCC
      0.1
      100
      mA
      SERIAL BUS DIGITAL INPUTS (SCL, SDA)
      Input High Voltage, VIH
      2.2
      V
      Input Low Voltage, VIL
      0.8
      V
      Hysteresis
      500
      mV
      Glitch Immunity
      100
      ns
      DIGITAL INPUT LOGIC LEVELS (ADD, CI, RESET, VID0VID4, FAN1, FAN2) (Note 7)
      Input High Voltage, VIH
      VCC = 2.85 V 5.5 V
      2.2
      V
      Input Low Voltage, VIL
      VCC = 2.85 V 5.5 V
      0.8
      V
      NTEST_IN
      Input High Current, IIH
      VCC = 2.85 V 5.5 V
      2.2
      V
      DIGITAL INPUT CURRENT
      Input High Current, IIH
      VIN = VCC
      –1.0
      mA
      Input Low Current, IIL
      VIN = 0
      1.0
      mA
      Input Capacitance, CIN
      20
      pF
      SERIAL BUS TIMING (Note 8)
      Clock Frequency, fSCLK
      See Figure 2
      400
      kHz
      Glitch Immunity, tSW
      See Figure 2
      50
      ns
      Bus Free Time, tBUF
      See Figure 2
      1.3
      ms
      Start Setup Time, tSU; STA
      See Figure 2
      600
      ns
      Start Hold Time, tHD; STA
      See Figure 2
      600
      ns
      SCL Low Time, tLOW
      See Figure 2
      1.3
      ms
      SCL High Time, tHIGH
      See Figure 2
      0.6
      ms
      SCL, SDA Rise Time, tr
      See Figure 2
      300
      ns
      SCL, SDA Fall Time, tf
      See Figure 2
      300
      ms
      Data Setup Time, tSU; DAT
      See Figure 2
      100
      ns
      Data Hold Time, tHD; DAT
      See Figure 2
      900
      ns
      1. All voltages are measured with respect to GND, unless otherwise specified.
      2. Typicals are at TA = 25C and represent the most likely parametric norm. Shutdown current typ is measured with VCC = 3.3V.
      3. TUE (Total Unadjusted Error) includes Offset, Gain, and Linearity errors of the ADC, multiplexer, and on-chip input attenuators, including
      an external series input protection resistor value between 0 kW and 1 kW.
      4. Total monitoring cycle time is nominally m 755 ms + n 33244 ms, where m is the number of channels configured as analog inputs, plus 2
      for the internal VCC measurement and internal temperature sensor, and n is the number of channels configured as external temperature
      channels (D1 and D2).
      5. The total fan count is based on two pulses per revolution of the fan tachometer output.
      6. Opendrain digital outputs may have an external pullup resistor connected to a voltage lower or higher than VCC (up to 6.5 V absolute maximum).
      7. All logic inputs except ADD are tolerant of 5.0 V logic levels, even if VCC is less than 5.0 V. ADD is a three-state input that may be connected
      to VCC, GND, or left opencircuit.
      8. Timing specifications are tested at logic levels of VIL = 0.8 V for a falling edge and VIH = 2.2 V for a rising edge.
      Figure 2. Serial Bus Timing Diagram
      P
      S
      PS
      SCL
      SDA
      tR
      tF
      tLOW
      tHD:STA
      tHD:DAT
      tHIGH
      tSU:DAT
      tSU:STA
      tHD:STA
      tSU:STO
      tBUF
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