參數(shù)資料
型號: AD9952YSVZ
廠商: Analog Devices Inc
文件頁數(shù): 25/28頁
文件大小: 0K
描述: IC DDS 14BIT DAC 1.8V 48-TQFP
產(chǎn)品培訓(xùn)模塊: Direct Digital Synthesis Tutorial Series (1 of 7): Introduction
Direct Digital Synthesizer Tutorial Series (7 of 7): DDS in Action
Direct Digital Synthesis Tutorial Series (3 of 7): Angle to Amplitude Converter
Direct Digital Synthesis Tutorial Series (6 of 7): SINC Envelope Correction
Direct Digital Synthesis Tutorial Series (4 of 7): Digital-to-Analog Converter
Direct Digital Synthesis Tutorial Series (2 of 7): The Accumulator
標(biāo)準(zhǔn)包裝: 1
分辨率(位): 14 b
主 fclk: 400MHz
調(diào)節(jié)字寬(位): 32 b
電源電壓: 1.71 V ~ 1.96 V
工作溫度: -40°C ~ 105°C
安裝類型: 表面貼裝
封裝/外殼: 48-TQFP 裸露焊盤
供應(yīng)商設(shè)備封裝: 48-TQFP 裸露焊盤(7x7)
包裝: 托盤
產(chǎn)品目錄頁面: 552 (CN2011-ZH PDF)
AD9952
Rev. B | Page 6 of 28
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter
Rating
Maximum Junction Temperature
150°C
DVDD_I/O
4 V
AVDD, DVDD
2 V
Digital Input Voltage (DVDD_I/O = 3.3 V)
–0.7 V to +5.25 V
Digital Input Voltage (DVDD_I/O = 1.8 V)
–0.7 V to +2.2 V
Digital Output Current
5 mA
Storage Temperature Range
–65°C to +150°C
Operating Temperature Range
–40°C to +105°C
Lead Temperature (10 sec Soldering)
300°C
θ
JA
38°C/W
θ
JC
15°C/W
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
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