- 鎮ㄧ従(xi脿n)鍦ㄧ殑浣嶇疆锛�璨疯常IC缍�(w菐ng) > PDF鐩寗8551 > AD664KP (Analog Devices Inc)IC DAC 12BIT QUAD MONO 44-PLCC PDF璩囨枡涓嬭級
鍙冩暩(sh霉)璩囨枡
| 鍨嬭櫉(h脿o)锛� | AD664KP |
| 寤犲晢锛� | Analog Devices Inc |
| 鏂囦欢闋佹暩(sh霉)锛� | 17/23闋� |
| 鏂囦欢澶у皬锛� | 0K |
| 鎻忚堪锛� | IC DAC 12BIT QUAD MONO 44-PLCC |
| 鐢�(ch菐n)鍝佸煿瑷�(x霉n)妯″锛� | Data Converter Fundamentals DAC Architectures |
| 妯�(bi膩o)婧�(zh菙n)鍖呰锛� | 1 |
| 瑷�(sh猫)缃檪(sh铆)闁擄細 | 8µs |
| 浣嶆暩(sh霉)锛� | 12 |
| 鏁�(sh霉)鎿�(j霉)鎺ュ彛锛� | 骞惰伅(li谩n) |
| 杞�(zhu菐n)鎻涘櫒鏁�(sh霉)鐩細 | 4 |
| 闆诲闆绘簮锛� | 闆� ± |
| 鍔熺巼鑰楁暎锛堟渶澶э級锛� | 525mW |
| 宸ヤ綔婧害锛� | 0°C ~ 70°C |
| 瀹夎椤炲瀷锛� | 琛ㄩ潰璨艰 |
| 灏佽/澶栨锛� | 44-LCC锛圝 褰㈠紩绶氾級 |
| 渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁濓細 | 44-PLCC锛�16.59x16.59锛� |
| 鍖呰锛� | 绠′欢 |
| 杓稿嚭鏁�(sh霉)鐩拰椤炲瀷锛� | 4 闆诲锛屽柈妤�锛�4 闆诲锛岄洐妤� |
| 閲囨ǎ鐜囷紙姣忕锛夛細 | 125k |
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AD664
Model
JN/JP/AD/AJ/SD
KN/KP/BD/BJ/BE/TD/TE
Min
Typ
Max
Min
Typ
Max
Units
DIGITAL INPUTS
VIH
2.0
*
Volts
VIL
0
0.8
*
Volts
Data Inputs
IIH @ VIN = VLL
鈥�10
卤1
10
**
*
A
IIL @ VIN = DGND
鈥�10
卤1
10
**
*
A
CS
/DS0/DS1/RST/RD/LS
IIH @ VIN = VLL
鈥�10
卤1
10
**
*
A
IIL @ VIN = VLL
鈥�10
卤1
10
**
*
A
MS
/TR12
IIH @ VIN = VLL
鈥�10
5
10
**
*
A
IIL @ VIN = DGND
鈥�10
鈥�5
0
**
*
A
QS0
/QSl/QS2 l2
IIH @ VIN = VLL
鈥�10
5
10
**
*
A
IIL @ VIN = DGND
鈥�10
卤1
10
**
*
A
DIGITAL OUTPUTS
VOL @ 1.6 mA Sink
0.4
*
Volts
VOH @ 0.5 mA Source
2.4
*
Volts
TEMPERATURE RANGE
JN/JP/KN/KP
0
+70
**
掳C
AD/AJ/BD/BJ/BE
鈥� 40
+85
**
掳C
SD/TD/TE
鈥�55
+125
**
掳C
NOTES
1A minimum power supply of
卤12.0 V is required for 0 V to +10 V and 卤10 V operation. A minimum power supply of 卤11.4 V is required for 鈥�5 V to +5 V operation.
2For V
CC < +12 V and VEE > 鈥�12 V. Voltage not to exeeed 10 V maximum.
3Bipolar zero error is the difference from the ideal output (0 volts) and the actual output voltage with code 100 000 000 000 applied to the inputs.
4Linearity error is defined as the maximum deviation of the actual DAC output from the ideal output (a straight line drawn from 0 to F.S. 鈥� 1 LSB).
5FSR means Full-Scale Range and is 20 V for
卤10 V range and 10 V for 卤 5 V range.
6A minimum power supply of
卤12.0 V is required for a 10 V reference voltage.
7Analog Ground Current is input code dependent.
8Gain error matching is the largest difference in gain error between any two DACs in one package.
9Offset error matching is the largest difference in offset error between any two DACs in one package.
10Bipolar zero error matching is the largest difference in bipolar zero error between any two DACs in one package.
11Linearity error matching is the difference in the worst ease linearity error between any two DACs in one package.
1244-pin versions only.
*Specifications same as JN/JP/AD/AJ/SD.
Specifications subject to change without notice.
Specifications shown in boldface are tested on all production units at final electrical test. Results from those tests are used to calculate outgoing quality levels. All min
and max specifications are guaranteed, although only those shown in boldface are tested on all production units.
ABSOLUTE MAXIMUM RATINGS*
VLL to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V to +7 V
VCC to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V to +18 V
VEE to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . 鈥�18 V to 0 V
Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +300
掳C, 10 sec
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . 1000 mW
AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . 鈥�1 V to +1 V
Reference Input . . . . . . . . . . . . . . . . . . VREF
鈮� 卤10 V and V
REF
鈮� (V
CC 鈥� 2 V, VEE + 2 V)
VCC to VEE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 to +36 V
CAUTION
ESD (electrostatic discharge) sensitive device. Unused devices must be stored in conductive foam
or shunts. The protective foam should be discharged to the destination socket before devices are
removed.
WARNING!
ESD SENSITIVE DEVICE
Digital Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . 鈥�0.3 V to +7 V
Analog Outputs . . . . . . . . . . . . . . . . . . . . . Indefinite Shorts to
VCC, VLL, VEE and GND
*Stresses above those listed under 鈥淎bsolute Maximum Ratings鈥� may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the
operational section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
REV.
鈥�3鈥�
D
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