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參數(shù)資料
| 型號： | 74LVTH182512DGGRE4 |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO64 |
| 封裝： | GREEN, PLASTIC, TSSOP-64 |
| 文件頁數(shù)： | 38/38頁 |
| 文件大?。?/td> | 735K |
| 代理商： | 74LVTH182512DGGRE4 |
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SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS671B – AUGUST 1996 – REVISED OCTOBER 1997
9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
data register description
boundary-scan register
The boundary-scan register (BSR) is 48 bits long. It contains one boundary-scan cell (BSC) for each
normal-function input pin and one BSC for each normal-function I/O pin (one single cell for both input data and
output data). The BSR is used to store test data that is to be applied externally to the device output pins, and/or
to capture data that appears internally at the outputs of the normal on-chip logic and/or externally at the device
input pins.
The source of data to be captured into the BSR during Capture-DR is determined by the current instruction. The
contents of the BSR can change during Run-Test /Idle as determined by the current instruction. At power up or
in Test-Logic-Reset, BSCs 47–44 are reset to logic 1, ensuring that these cells, which control A-port and B-port
outputs are set to benign values (i.e., if test mode were invoked, the outputs would be at the high-impedance
state). Reset values of other BSCs should be considered indeterminate.
The BSR order of scan is from TDI through bits 47–0 to TDO. Table 1 shows the BSR bits and their associated
device pin signals.
Table 1. Boundary-Scan Register Configuration
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
47
2OEAB
35
2A9-I/O
17
2B9-I/O
46
1OEAB
34
2A8-I/O
16
2B8-I/O
45
2OEBA
33
2A7-I/O
15
2B7-I/O
44
1OEBA
32
2A6-I/O
14
2B6-I/O
43
2CLKAB
31
2A5-I/O
13
2B5-I/O
42
1CLKAB
30
2A4-I/O
12
2B4-I/O
41
2CLKBA
29
2A3-I/O
11
2B3-I/O
40
1CLKBA
28
2A2-I/O
10
2B2-I/O
39
2LEAB
27
2A1-I/O
9
2B1-I/O
38
1LEAB
26
1A9-I/O
8
1B9-I/O
37
2LEBA
25
1A8-I/O
7
1B8-I/O
36
1LEBA
24
1A7-I/O
6
1B7-I/O
––
23
1A6-I/O
5
1B6-I/O
––
22
1A5-I/O
4
1B5-I/O
––
21
1A4-I/O
3
1B4-I/O
––
20
1A3-I/O
2
1B3-I/O
––
19
1A2-I/O
1
1B2-I/O
––
18
1A1-I/O
0
1B1-I/O
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| 74LVTH182512DGGRG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| 74LVTH182646APMG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| 74LVTH182652APMG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| 74LVTH18502APMRG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| 74LVTH18504APMRG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
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