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參數(shù)資料
| 型號： | 74LVTH182512DGGRE4 |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO64 |
| 封裝： | GREEN, PLASTIC, TSSOP-64 |
| 文件頁數(shù)： | 25/38頁 |
| 文件大?。?/td> | 735K |
| 代理商： | 74LVTH182512DGGRE4 |
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SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS671B – AUGUST 1996 – REVISED OCTOBER 1997
31
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (normal mode) (see Figure 14)
SN54LVTH182512
SN74LVTH182512
VCC = 3.3 V
± 0.3 V
VCC = 2.7 V
VCC = 3.3 V
± 0.3 V
VCC = 2.7 V
UNIT
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
Clock frequency
CLKAB or CLKBA
0
100
0
80
0
100
0
80
MHz
t
Pulse duration
CLKAB or CLKBA high or low
4.4
5.6
4.4
5.6
ns
tw
Pulse duration
LEAB or LEBA high
3
ns
t
St
ti
A before CLKAB
↑ or
B before CLKBA
↑
2.8
3
2.8
3
tsu
Setup time
A before LEAB
↓ or
CLK high
1.5
0.7
1.5
0.7
ns
A before LEAB
↓ or
B before LEBA
↓
CLK low
1.6
th
Hold time
A after CLKAB
↑ or
B after CLKBA
↑
1.4
1.1
1.4
1.1
ns
h
A after LEAB
↓ or B after LEBA↓
3.1
3.5
3.1
3.5
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (test mode) (see Figure 14)
SN54LVTH182512
SN74LVTH182512
VCC = 3.3 V
± 0.3 V
VCC = 2.7 V
VCC = 3.3 V
± 0.3 V
VCC = 2.7 V
UNIT
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
Clock frequency
TCK
0
50
0
40
0
50
0
40
MHz
tw
Pulse duration
TCK high or low
9.5
10.5
9.5
10.5
ns
t
St
ti
A, B, CLK, LE, or OE
before TCK
↑
6.5
7
6.5
7
tsu
Setup time
TDI before TCK
↑
2.5
3.5
2.5
3.5
ns
TMS before TCK
↑
2.5
3.5
2.5
3.5
A, B, CLK, LE, or OE after TCK
↑
1.7
1
1.7
1
th
Hold time
TDI after TCK
↑
1.5
1
1.5
1
ns
TMS after TCK
↑
1.5
1
1.5
1
td
Delay time
Power up to TCK
↑
50
ns
tr
Rise time
VCC power up
1
s
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
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相關代理商/技術參數(shù) |
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| 74LVTH182512DGGRG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| 74LVTH182646APMG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| 74LVTH182652APMG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| 74LVTH18502APMRG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| 74LVTH18504APMRG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
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