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          參數(shù)資料
          

          


          


          
型號(hào)：
74LVTH182512DGGRE4

          

          
廠商：
TEXAS INSTRUMENTS INC

          

          
元件分類：
總線收發(fā)器

          

          
英文描述：
LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO64

          

          
封裝：
GREEN, PLASTIC, TSSOP-64

          

          
文件頁(yè)數(shù)：
33/38頁(yè)

          

          
文件大?。?/td>
735K

          

          
代理商：
74LVTH182512DGGRE4


          

          

          

	
          
    
    

    
          
	
          SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512
          3.3-V ABT SCAN TEST DEVICES
          WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
          SCBS671B – AUGUST 1996 – REVISED OCTOBER 1997
          4
          POST OFFICE BOX 655303
           DALLAS, TEXAS 75265
          Terminal Functions
          TERMINAL NAME
          DESCRIPTION
          1A1–1A9,
          2A1–2A9
          Normal-function A-bus I/O ports. See function table for normal-mode logic.
          1B1–1B9,
          2B1–2B9
          Normal-function B-bus I/O ports. See function table for normal-mode logic.
          1CLKAB, 1CLKBA,
          2CLKAB, 2CLKBA
          Normal-function clock inputs. See function table for normal-mode logic.
          GND
          Ground
          1LEAB, 1LEBA,
          2LEAB, 2LEBA
          Normal-function latch enables. See function table for normal-mode logic.
          1OEAB, 1OEBA,
          2OEAB, 2OEBA
          Normal-function output enables. See function table for normal-mode logic. An internal pullup at each terminal forces the
          terminal to a high level if left unconnected.
          TCK
          Test clock. One of four terminals required by IEEE Std 1149.1-1990. Test operations of the device are synchronous to
          TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
          TDI
          Test data input. One of four terminals required by IEEE Std 1149.1-1990. TDI is the serial input for shifting data through
          the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
          TDO
          Test data output. One of four terminals required by IEEE Std 1149.1-1990. TDO is the serial output for shifting data
          through the instruction register or selected data register.
          TMS
          Test mode select. One of four terminals required by IEEE Std 1149.1-1990. TMS directs the device through its TAP
          controller states. An internal pullup forces TMS to a high level if left unconnected.
          VCC
          Supply voltage
          
    
          
    
    
          


          


          

          相關(guān)PDF資料
          		

          PDF描述
          		

          
          

          
74LVTH182512DGGRG4
LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO64

          

          
74LVX573MTR
LV/LV-A/LVX/H SERIES, 8-BIT DRIVER, TRUE OUTPUT, PDSO20

          

          
74VHC03TTR
AHC/VHC SERIES, QUAD 2-INPUT NAND GATE, PDSO14

          

          
74VHC112M
Dual J-K Flip-Flops with Preset and Clear

          

          
74VHC112MTC
Dual J-K Flip-Flops with Preset and Clear

          

          

          

          


          


          

          相關(guān)代理商/技術(shù)參數(shù)
          		

          參數(shù)描述
          		

          
          

          
74LVTH182512DGGRG4
功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube

          

          
74LVTH182646APMG4
功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube

          

          
74LVTH182652APMG4
功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube

          

          
74LVTH18502APMRG4
功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube

          

          
74LVTH18504APMRG4
功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube

          

          
    
    
    
	
          	
    
    
     
     
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