- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄222840 > 74LVTH182512DGGRE4 (TEXAS INSTRUMENTS INC) LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO64 PDF資料下載
參數(shù)資料
| 型號： | 74LVTH182512DGGRE4 |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO64 |
| 封裝： | GREEN, PLASTIC, TSSOP-64 |
| 文件頁數(shù)： | 33/38頁 |
| 文件大小： | 735K |
| 代理商： | 74LVTH182512DGGRE4 |
第1頁第2頁第3頁第4頁第5頁第6頁第7頁第8頁第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁第21頁第22頁第23頁第24頁第25頁第26頁第27頁第28頁第29頁第30頁第31頁第32頁當(dāng)前第33頁第34頁第35頁第36頁第37頁第38頁
SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS671B – AUGUST 1996 – REVISED OCTOBER 1997
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL NAME
DESCRIPTION
1A1–1A9,
2A1–2A9
Normal-function A-bus I/O ports. See function table for normal-mode logic.
1B1–1B9,
2B1–2B9
Normal-function B-bus I/O ports. See function table for normal-mode logic.
1CLKAB, 1CLKBA,
2CLKAB, 2CLKBA
Normal-function clock inputs. See function table for normal-mode logic.
GND
Ground
1LEAB, 1LEBA,
2LEAB, 2LEBA
Normal-function latch enables. See function table for normal-mode logic.
1OEAB, 1OEBA,
2OEAB, 2OEBA
Normal-function output enables. See function table for normal-mode logic. An internal pullup at each terminal forces the
terminal to a high level if left unconnected.
TCK
Test clock. One of four terminals required by IEEE Std 1149.1-1990. Test operations of the device are synchronous to
TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four terminals required by IEEE Std 1149.1-1990. TDI is the serial input for shifting data through
the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Std 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
TMS
Test mode select. One of four terminals required by IEEE Std 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| 74LVTH182512DGGRG4 | LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO64 |
| 74LVX573MTR | LV/LV-A/LVX/H SERIES, 8-BIT DRIVER, TRUE OUTPUT, PDSO20 |
| 74VHC03TTR | AHC/VHC SERIES, QUAD 2-INPUT NAND GATE, PDSO14 |
| 74VHC112M | Dual J-K Flip-Flops with Preset and Clear |
| 74VHC112MTC | Dual J-K Flip-Flops with Preset and Clear |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| 74LVTH182512DGGRG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| 74LVTH182646APMG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| 74LVTH182652APMG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| 74LVTH18502APMRG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| 74LVTH18504APMRG4 | 功能描述:特定功能邏輯 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。