參數(shù)資料
型號(hào)： 5962-0720601VXC
元件分類： ADC
英文描述： 3-CH 14-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, CQFP52
封裝： CERAMIC, QFP-52
文件頁(yè)數(shù)： 12/21頁(yè)
文件大小： 433K
代理商： 5962-0720601VXC
Reference
Timing
CLK+
OVR
D[13:0]
CLK
6
DMID
DRY
VREF
AIN
TH1
5
Σ
DAC2
ADC2
ADC3
Σ
DAC1
ADC1
A3
A1
TH2
TH3
C1
C2
AVDD
DRVDD
GND
Digital Error Correction
A2
+
+
ABSOLUTE MAXIMUM RATINGS
SLWS194 – MAY 2008 ....................................................................................................................................................................................................... www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
FUNCTIONAL BLOCK DIAGRAM
over operating temperature range (unless otherwise noted)
(1)
ADS5424
UNIT
AVDD to GND
6
Supply voltage
V
DRVDD to GND
5
Analog input to GND
–0.3 V to AVDD + 0.3
V
Clock input to GND
–0.3 V to AVDD + 0.3
V
CLK to CLK
±2.5
V
Digital data output to GND
–0.3 V to DRVDD + 0.3
V
TC
Characterized case operating temperature range
–55
°C to 125
°C
TJ
Maximum junction temperature
150
°C
Tstg
Storage temperature range
–65
°C to 150
°C
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only and functional operation of the device at these or any other conditions beyond
those specified is not implied.
2
Copyright 2008, Texas Instruments Incorporated
Product Folder Link(s): ADS5424-SP
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