參數(shù)資料
型號: UPD7554AG
廠商: NEC Corp.
英文描述: 4-BIT SINGLE-CHIP MICROCOMPUTER
中文描述: 4位單片機
文件頁數(shù): 25/64頁
文件大?。?/td> 991K
代理商: UPD7554AG
25
μ
PD7554A, 7554A(A)
Fig. 2-16 Shift Mode Register Format
Shift Mode Register
Settings for serial interface operation and the associated mode of the port 0
INT0/INTS selection
SM3
Test Sources
0
INTS
1
INT0
Caution
When setting a code in the shift mode register using the OPL instruction, be sure to set bit 0 of the
accumulator to 0 (Bit 0 corresponds to CM0 of the
μ
PD7500H of EVAKIT-7500B in emulation).
In the system which does not require serial interface, the 8-bit shift register can be used as a simple register and
data can be read or writtene by the TSIOAM or TAMSIO instruction when serial operation is off.
2.13 TEST CONTROL CIRCUIT
The
μ
PD7554A is provided with the following three types of test sources (one external source and two internal
sources):
The test control circuit checks consist mainly of test request flags (INTT RQF and INT0/S RQF) which are set by
three different test sources and the test request flag control circuit which checks the content of test request flags
using the SKI instruction and controls resetting the checked flags.
The INT0 and INTS are common in the request flag. Which one is selected is determined by bit 3 (SM3) of the
shift mode register.
SM3
SM2
SM1
SM2
SM1
P03/SI
P02/SO
P01/SCK
Serial Operation
0
0
Port input
Port input
Port input
Stop
0
1
φ
continuous output
1
0
SI input
SO output
SCK input
Operation based on external clock
1
1
SCK output (
φ
×
8)
Operation based on
φ
Test Sources
Internal/External
Request Flag
INTT (Overflow from timer/event counter)
Internal
INTT RQF
INT0 (Test request signal from P00 pin)
External
INT 0/S RQF
INTS (Transfer end signal from serial interface)
Internal
SM3
Test Sources
0
INTS
1
INT0
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