參數(shù)資料
型號： SN74BCT8374ANTE4
廠商： Texas Instruments, Inc.
英文描述： SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
中文描述： 掃描測試設(shè)備與八路D型邊沿觸發(fā)觸發(fā)器
文件頁數(shù)： 19/26頁
文件大?。?/td> 474K
代理商： SN74BCT8374ANTE4
SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E – JUNE 1990 – REVISED JULY 1996
19
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (normal mode) (see Figure 9)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
VCC = 5 V,
TA = 25
°
C
MIN
SN54BCT8374A
SN74BCT8374A
UNIT
TYP
MAX
MIN
MAX
MIN
MAX
fmax
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
CLK
70
70
70
MHz
CLK
Q
3
6.7
8.5
3
10.5
3
10
ns
3
6.4
8
3
10
3
9.5
OE
Q
3
6.5
8.5
3
10.5
3
10
ns
3.5
7.5
9.5
3.5
12.5
3.5
11
OE
Q
3
6.1
5.8
8
3
10
9.5
3
9
ns
2.5
7.5
2.5
2.5
8.5
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Figure 9)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
VCC = 5 V,
TA = 25
°
C
MIN
SN54BCT8374A
SN74BCT8374A
UNIT
TYP
MAX
MIN
MAX
MIN
MAX
fmax
tPLH
tPHL
tPLH
tPHL
tPLH
tPHL
tPZH
tPZL
tPZH
tPZL
tPZH
tPZL
tPHZ
tPLZ
tPHZ
tPLZ
tPHZ
tPLZ
TCK
20
20
20
MHz
TCK
↓
Q
6
13
15.5
6
21.5
6
20
ns
6
12.5
15.5
6
21.5
6
20
TCK
↓
TDO
3.5
7.6
10.5
3.5
14
3.5
13
ns
3.5
8
10.5
3.5
13
3.5
12
TCK
↑
Q
7.5
16.5
20
7.5
28
7.5
24
ns
7.5
17
21
7.5
29
7.5
25
TCK
↓
Q
6.5
14
17
6.5
24
6.5
21
ns
7
15
20
7
26
7
23
TCK
↓
TDO
3.5
7.6
10.5
3.5
11.5
3.5
11
ns
4
8.5
11
4
13.5
4
12.5
TCK
↑
Q
8
18
22
8
30
8
27
ns
8
19
25
8
32
8
29
TCK
↓
Q
6
14
18
6
24
6
22
ns
6
14
17
6
23
6
21
TCK
↓
TDO
3
8
11.5
3
13
3
12.5
ns
3
7.5
10
3
13
3
12
TCK
↑
Q
8
8
18.5
18.5
22
22
8
8
31
31
8
8
27
27
ns
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