參數(shù)資料
型號: SN54BCT8374AJT
廠商: Texas Instruments, Inc.
英文描述: SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
中文描述: 掃描測試設備與八路D型邊沿觸發(fā)觸發(fā)器
文件頁數(shù): 25/26頁
文件大?。?/td> 474K
代理商: SN54BCT8374AJT
相關PDF資料
PDF描述
SN74BCT8374ANT SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN74BCT8374ADWR Replaced by BQ20Z80A-V110 : Impedance Track (TM) 1% accurate Gas Gauge for LiIon batteries SBS1.1 compliant 38-TSSOP -40 to 85
SN74BCT8374ADWRE4 Replaced by BQ20Z80A-V110 : Impedance Track (TM) 1% accurate Gas Gauge for LiIon batteries SBS1.1 compliant 38-TSSOP -40 to 85
SN74CBT16210DGV 20-BIT FET BUS SWITCH
SN74CBT16210DGG 20-BIT FET BUS SWITCH
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