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參數(shù)資料
| 型號(hào)： | SN54BCT8374AJT |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
| 中文描述： | 掃描測試設(shè)備與八路D型邊沿觸發(fā)觸發(fā)器 |
| 文件頁數(shù)： | 2/26頁 |
| 文件大?。?/td> | 474K |
| 代理商： | SN54BCT8374AJT |
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SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E – JUNE 1990 – REVISED JULY 1996
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output
(TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing
functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
The SN54BCT8374A is characterized for operation over the full military temperature range of –55
°
C to 125
°
C.
The SN74BCT8374A is characterized for operation from 0
°
C to 70
°
C.
FUNCTION TABLE
(normal mode, each flip-flop)
INPUTS
CLK
↑
↑
H or L
OUTPUT
Q
OE
D
L
H
H
L
L
L
L
X
Q0
Z
H
X
X
logic symbol
SCAN
’BCT8374A
1D
23
1D
1Q
2
TDI
14
TDI
TCK-IN
EN
24
22
2D
2Q
3
TMS
12
TMS
13
TCK
1
CLK
TCK-OUT
21
3D
3Q
4
20
4D
4Q
5
19
5D
5Q
7
17
6D
6Q
8
16
7D
7Q
9
15
8D
8Q
10
OE
Φ
C1
TDO
11
TDO
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the DW, JT, and NT packages.
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