參數(shù)資料
型號： SN54BCT8374AJT
廠商： Texas Instruments, Inc.
英文描述： SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
中文描述： 掃描測試設(shè)備與八路D型邊沿觸發(fā)觸發(fā)器
文件頁數(shù)： 23/26頁
文件大?。?/td> 474K
代理商： SN54BCT8374AJT
MECHANICAL DATA
MLCC006B – OCTOBER 1996
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
FK (S-CQCC-N**)
LEADLESS CERAMIC CHIP CARRIER
4040140/D 10/96
28 TERMINAL SHOWN
B
0.358
(9,09)
MAX
(11,63)
0.560
(14,22)
0.560
(14,22)
0.458
0.858
(21,8)
1.063
(27,0)
A
NO. OF
TERMINALS
MIN
MAX
0.358
(9,09)
0.660
(16,76)
0.761
(19,32)
0.458
(11,63)
0.342
(8,69)
MIN
(11,23)
(16,26)
0.640
0.739
(18,78)
0.442
0.962
(24,43)
1.165
(29,59)
(23,83)
0.938
(28,99)
1.141
**
20
28
52
44
68
84
0.020 (0,51)
0.010 (0,25)
0.080 (2,03)
0.064 (1,63)
(7,80)
0.307
(10,31)
0.406
(12,58)
0.495
(12,58)
0.495
(21,6)
0.850
(26,6)
1.047
0.045 (1,14)
0.035 (0,89)
0.045 (1,14)
0.035 (0,89)
12
13
14
15
16
18
17
11
10
8
9
7
5
4
3
2
0.020 (0,51)
0.010 (0,25)
6
1
28
26
27
19
21
B SQ
A SQ
22
23
24
25
20
0.055 (1,40)
0.045 (1,14)
0.028 (0,71)
0.022 (0,54)
0.050 (1,27)
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice.
C. This package can be hermetically sealed with a metal lid.
D. The terminals are gold plated.
E. Falls within JEDEC MS-004
相關(guān)PDF資料
PDF描述
SN74BCT8374ANT SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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SN74BCT8374ADWRE4 Replaced by BQ20Z80A-V110 : Impedance Track (TM) 1% accurate Gas Gauge for LiIon batteries SBS1.1 compliant 38-TSSOP -40 to 85
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