參數(shù)資料
型號: SN54BCT8240AJT
廠商: Texas Instruments, Inc.
英文描述: SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
中文描述: 掃描測試設(shè)備與八進制反向緩沖器
文件頁數(shù): 21/26頁
文件大?。?/td> 473K
代理商: SN54BCT8240AJT
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package
Type
LCCC
CDIP
SOIC
Package
Drawing
FK
JT
DW
Pins Package
Qty
1
1
25
Eco Plan
(2)
Lead/Ball Finish
MSL Peak Temp
(3)
5962-9174601Q3A
5962-9174601QLA
SN74BCT8240ADW
ACTIVE
ACTIVE
ACTIVE
28
24
24
TBD
TBD
Call TI
Call TI
CU NIPDAU
Level-NC-NC-NC
Level-NC-NC-NC
Level-1-260C-UNLIM
Green (RoHS &
no Sb/Br)
Green (RoHS &
no Sb/Br)
2000 Green (RoHS &
no Sb/Br)
2000 Green (RoHS &
no Sb/Br)
15
Pb-Free
(RoHS)
15
Pb-Free
(RoHS)
1
1
SN74BCT8240ADWE4
ACTIVE
SOIC
DW
24
25
CU NIPDAU
Level-1-260C-UNLIM
SN74BCT8240ADWR
ACTIVE
SOIC
DW
24
CU NIPDAU
Level-1-260C-UNLIM
SN74BCT8240ADWRE4
ACTIVE
SOIC
DW
24
CU NIPDAU
Level-1-260C-UNLIM
SN74BCT8240ANT
ACTIVE
PDIP
NT
24
CU NIPDAU
Level-NC-NC-NC
SN74BCT8240ANTE4
ACTIVE
PDIP
NT
24
CU NIPDAU
Level-NC-NC-NC
SNJ54BCT8240AFK
SNJ54BCT8240AJT
ACTIVE
ACTIVE
LCCC
CDIP
FK
JT
28
24
TBD
TBD
Call TI
Call TI
Level-NC-NC-NC
Level-NC-NC-NC
(1)
The marketing status values are defined as follows:
ACTIVE:
Product device recommended for new designs.
LIFEBUY:
TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND:
Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW:
Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE:
TI has discontinued the production of the device.
(2)
for the latest availability information and additional product content details.
The Pb-Free/Green conversion plan has not been defined.
相關(guān)PDF資料
PDF描述
SN74BCT8240ANT SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
SN74BCT8240ANTE4 SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
SN74BCT8374ANTE4 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN54BCT8374AFK SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN54BCT8374AJT SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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