參數(shù)資料
型號(hào)： SN54BCT8240AJT
廠商： Texas Instruments, Inc.
英文描述： SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
中文描述： 掃描測(cè)試設(shè)備與八進(jìn)制反向緩沖器
文件頁(yè)數(shù)： 2/26頁(yè)
文件大?。?/td> 473K
代理商： SN54BCT8240AJT
SN54BCT8240A, SN74BCT8240A
SCAN TEST DEVICES
WITH OCTAL INVERTING BUFFERS
SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output
(TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing
functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
The SN54BCT8240A is characterized for operation over the full military temperature range of –55
°
C to 125
°
C.
The SN74BCT8240A is characterized for operation from 0
°
C to 70
°
C.
FUNCTION TABLE
(normal mode, each buffer)
INPUTS
OE
OUTPUT
Y
A
H
X
Z
L
L
H
L
H
L
logic symbol
SCAN
’BCT8240A
23
1A1
1Y1
2
TDI
14
TDI
TCK-IN
EN1
1
22
1A2
1Y2
3
TMS
12
TMS
13
TCK
EN2
24
TCK-OUT
21
1A3
1Y3
4
20
1A4
1Y4
5
19
2A1
2Y1
7
17
2A2
2Y2
8
16
2A3
2Y3
9
15
2A4
2Y4
10
2OE
1OE
Φ
1
2
TDO
11
TDO
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the DW, JT, and NT packages.
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