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參數(shù)資料
| 型號： | SN54ABT18245AWD |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS |
| 中文描述： | 掃描測試設(shè)備與18位總線收發(fā)器 |
| 文件頁數(shù)： | 4/28頁 |
| 文件大?。?/td> | 357K |
| 代理商： | SN54ABT18245AWD |
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SN54ABT18245A, SN74ABT18245A
SCAN TEST DEVICES
WITH 18-BIT BUS TRANSCEIVERS
SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
DESCRIPTION
1A1–1A9,
2A1–2A9
Normal-function A-bus I/O ports. See function table for normal-mode logic.
1B1–1B9,
2B1–2B9
Normal-function B-bus I/O ports. See function table for normal-mode logic.
1DIR, 2DIR
Normal-function direction controls. See function table for normal-mode logic.
GND
Ground
1OE, 2OE
Normal-function output enables. See function table for normal-mode logic.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to
TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data through
the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
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