- 您現(xiàn)在的位置：買(mǎi)賣(mài)IC網(wǎng) > PDF目錄365645 > SN54ABT18245AWD (Texas Instruments, Inc.) SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS PDF資料下載
參數(shù)資料
| 型號(hào)： | SN54ABT18245AWD |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS |
| 中文描述： | 掃描測(cè)試設(shè)備與18位總線收發(fā)器 |
| 文件頁(yè)數(shù)： | 2/28頁(yè) |
| 文件大?。?/td> | 357K |
| 代理商： | SN54ABT18245AWD |
第1頁(yè)當(dāng)前第2頁(yè)第3頁(yè)第4頁(yè)第5頁(yè)第6頁(yè)第7頁(yè)第8頁(yè)第9頁(yè)第10頁(yè)第11頁(yè)第12頁(yè)第13頁(yè)第14頁(yè)第15頁(yè)第16頁(yè)第17頁(yè)第18頁(yè)第19頁(yè)第20頁(yè)第21頁(yè)第22頁(yè)第23頁(yè)第24頁(yè)第25頁(yè)第26頁(yè)第27頁(yè)第28頁(yè)
SN54ABT18245A, SN74ABT18245A
SCAN TEST DEVICES
WITH 18-BIT BUS TRANSCEIVERS
SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Four dedicated test pins observe and control the operation of the test circuitry: test-data input (TDI), test-data
output (TDO), test-mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing
functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
The SN54ABT18245A is characterized for operation over the full military temperature range of –55
°
C to 125
°
C.
The SN74ABT18245A is characterized for operation from –40
°
C to 85
°
C.
FUNCTION TABLE
(normal mode, each 9-bit section)
INPUTS
OPERATION
OE
L
DIR
L
B data to A bus
L
H
A data to B bus
H
X
Isolation
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN74ABT245BGQNR | OCTAL BUS TRANSCEIVERS WITH 3 STATE OUTPUTS |
| SN74ABT245BZQNR | Circular Connector; Body Material:Aluminum; Series:PT06; No. of Contacts:32; Connector Shell Size:18; Connecting Termination:Solder; Circular Shell Style:Straight Plug; Circular Contact Gender:Pin; Insert Arrangement:18-32 |
| SN74ABT273DB | OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR |
| SN54ABT273FK | OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR |
| SN54ABT273J | OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABT18502 | 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
| SN54ABT18502HV | 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
| SN54ABT18504 | 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABT18504_08 | 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABT18504HV | 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。