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| 型號： | SN54ABT18245AWD |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS |
| 中文描述： | 掃描測試設(shè)備與18位總線收發(fā)器 |
| 文件頁數(shù)： | 1/28頁 |
| 文件大小： | 357K |
| 代理商： | SN54ABT18245AWD |
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SN54ABT18245A, SN74ABT18245A
SCAN TEST DEVICES
WITH 18-BIT BUS TRANSCEIVERS
SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Members of the Texas Instruments
SCOPE
Family of Testability Products
Members of the Texas Instruments
Widebus
Family
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
SCOPE
Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, CLAMP and HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
State-of-the-Art EPIC-
ΙΙ
B
BiCMOS Design
Significantly Reduces Power Dissipation
Packaged in Plastic Shrink Small-Outline
(DL) and Thin Shrink Small-Outline (DGG)
Packages and 380-mil Fine-Pitch Ceramic
Flat (WD) Packages
description
The ’ABT18245A scan test devices with 18-bit bus
transceivers are members of the Texas
Instruments SCOPE
testability integrated-
circuit family. This family of devices supports IEEE
Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit-board assemblies. Scan
access to the test circuitry is accomplished via the
4-wire test access port (TAP) interface.
In the normal mode, these devices are 18-bit noninverting bus transceivers. They can be used either as two
9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot
samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating
the TAP in the normal mode does not affect the functional operation of the SCOPE
bus transceivers.
Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is
allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. OE can
be used to disable the device so that the buses are effectively isolated.
In the test mode, the normal operation of the SCOPE
bus transceivers is inhibited and the test circuitry is
enabled to observe and control the input/output (I/O) boundary of the device. When enabled, the test circuitry
performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
Copyright
1999, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Widebus, and EPIC-
ΙΙ
B are trademarks of Texas Instruments Incorporated.
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1DIR
1B1
1B2
GND
1B3
1B4
V
CC
1B5
1B6
1B7
GND
1B8
1B9
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
V
CC
2B8
2B9
GND
2DIR
TDO
TMS
1OE
1A1
1A2
GND
1A3
1A4
V
CC
1A5
1A6
1A7
GND
1A8
1A9
2A1
2A2
2A3
2A4
GND
2A5
2A6
2A7
V
CC
2A8
2A9
GND
2OE
TDI
TCK
SN54ABT18245A . . . WD PACKAGE
SN74ABT18245A . . . DGG OR DL PACKAGE
(TOP VIEW)
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