參數(shù)資料
型號(hào): SL1ICS3001U
廠商: NXP SEMICONDUCTORS
元件分類: 消費(fèi)家電
英文描述: I.CODE1 Label IC Chip Specification
中文描述: SPECIALTY CONSUMER CIRCUIT, UUC4
封裝: DIE-4
文件頁(yè)數(shù): 17/22頁(yè)
文件大?。?/td> 376K
代理商: SL1ICS3001U
ICODE
1 Chip Specification
Rev. 2.1
May 2000
SL040521.doc/M
Public
Page 17 of 22
15 Inlet/Label Characterisation and Test
15.1 Characterisation of the Inlet/Label
The parameters recommended to be characterised for the inlet/label are:
Parameter
Symbol
Conditions
Resonant frequency
f
res
Resonant frequency @ T
amb
= 22 °C @ B
TH
No command transmitted to the inlet/label
à
Label generates no response
à
No modulation
Threshold value for
UNSELECTED READ command
(standard mode)
B
TH
UNSELECTED READ command OK
Threshold value for WRITE command
(standard mode)
B
WR
WRITE (and Verifying READ) command OK
15.2 Final Test of the Inlet/Label
Basic flow for production and test:
1.
Production of wafer
2.
Testing of dies on wafer
3.
Writing of serial numbers and pre-configuration
4.
Sawing of wafer
5.
Assembly of inlets/labels
6.
Final test of inlets/labels
7.
Writing of customer data
To detect damage of EEPROM cells during production of inlets/labels a final test of the
EEPROM after assembly of the inlet/label is recommended. This is necessary to achieve
lowest failure rates.
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