參數(shù)資料
型號(hào)： SCANSTA111SM
廠商： NATIONAL SEMICONDUCTOR CORP
元件分類： 微控制器/微處理器
英文描述： EMITTER IR 850NM 5MM RADIAL
中文描述： SPECIALTY MICROPROCESSOR CIRCUIT, PBGA49
封裝： BGA-49
文件頁(yè)數(shù)： 16/29頁(yè)
文件大?。?/td> 524K
代理商： SCANSTA111SM
Level 2 Protocol
(Continued)
Register Descriptions
INSTRUCTION REGISTER:
The instruction shift register is
an 8-bit register that is in series with the scan chain when-
ever the TAP Controller of the SCANSTA111 is in the
Shift-IR
state.
Upon
exiting
the
Capture-IR
XXXXXX01 is captured into the instruction register, where
XXXXXX represents the value on the S
inputs. When the
’STA111 controller is in the
Wait-For-Address
state, the in-
struction register is used for ’STA111 selection via address
matching. In addressing individual ’STA111s, the chip’s ad-
dressing logic performs a comparison between a statically-
configured (hard-wired) value on that ’STA111’s slot inputs,
and an address which is scanned into the chip’s instruction
register. Binary address codes 000000 through 111010 (00
through 3A Hex) are reserved for addressing individual
’STA111s. Address 3B Hex is for Broadcast mode.
During multi-cast (group) addressing, a scanned-in address
is compared against the (previously scanned-in) contents of
a ’STA111’s Multi-Cast Group register. Binary address codes
111110 through 111111 (3A through 3F Hex) are reserved for
multi-cast addressing, and should not be assigned as
’STA111 slot-input values.
BOUNDARY-SCAN REGISTER:
The boundary-scan regis-
ter is a sample only shift register containing cells from the
S
(0-6)
and OE inputs. The register allows testing of circuitry
external to the ’STA111. It permits the signals flowing be-
tween the system pins to be sampled and examined without
interfering with the operation of the on-chip system logic.
The scan chain is arranged as follows:
TDI
B
→
OE
→
S
6
→
S
5
→
S
4
→
S
3
→
S
2
→
S
1
→
S
0
→
TDO
B
BYPASS REGISTER:
The bypass register is a 1-bit register
that operates as specified in IEEE Std. 1149.1 once the
’STA111 has been selected. The register provides a mini-
mum length serial path for the movement of test data be-
tween TDI
and the LSPN. This path can be selected when
no other test data register needs to be accessed during a
board-level test operation. Use of the bypass register short-
ens the serial access-path to test data registers located in
other components on a board-level test data path.
MULTI-CAST GROUP REGISTER:
Multi-cast is a method of
simultaneously communicating with more than one selected
’STA111. The multi-cast group register (MCGR) is a 2-bit
state,
the
value
register used to determine which multi-cast group a particu-
lar ’STA111 is assigned to. Four addresses are reserved for
multi-cast addressing. When a ’STA111 is in the
Wait-For-
Address
state and receives a multi-cast address, and if that
’STA111’s MCGR contains a matching value for that multi-
cast address, the ’STA111 becomes selected and is ready to
receive Level 2 Protocol (i.e., further instructions).
The MCGR is initialized to 00 upon entering the
Test-Logic-
Reset
state.
TABLE 6. Multi-Cast Group Register Addressing
MCGR Bits 1,0
00
01
10
11
Hex Address
3C
3D
3E
3F
Binary Address
00111100
00111101
00111110
00111111
The following actions are used to perform multi-cast ad-
dressing:
1.
Assign all target ’STA111s to a multi-cast group by writ-
ing each individual target ’STA111’s MCGR with the
same multi-cast group code (see
Table 6
). This configu-
ration step must be done by individually addressing
each target ’STA111, using that chip’s assigned slot
value.
2.
Scan out the multi-cast group address through the TDI
B
input of all ’STA111s. Note that this occurs in parallel,
resulting in the selection of only those ’STA111s whose
MCGR was previously programmed with the matching
multi-cast group code.
MODE REGISTER
0
:
Mode Register
0
is an 8-bit data register
used primarily to configure the Local Scan Port Network.
Mode Register
0
is initialized to 00000001 binary upon enter-
ing the
Test-Logic-Reset
state. Bits 0, 1, 2, and 4 are used
for scan chain configuration as described in
Table 7
. When
the
UNPARK
instruction is executed, the scan chain configu-
ration is as shown in
Table 7
below. When all LSPs are
parked, the scan chain configuration is TDI
B
→
’STA111-
register
→
TDO
B
. Bit 3 is used for TCK
n
configuration, see
Table 8
.
TABLE 7. Mode Register Control of LSPN
Mode Register(s)
MR0: X000X000
Scan Chain Configuration (if unparked)
TDI
B
→
Register
→
TDO
B
10124513
FIGURE 10. Local Scan Port Synchronization from Parked-RTI State
S
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SCANSTA111SMX 功能描述:接口 - 專用 RoHS:否 制造商:Texas Instruments 產(chǎn)品類型:1080p60 Image Sensor Receiver 工作電源電壓:1.8 V 電源電流:89 mA 最大功率耗散: 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:BGA-59
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