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參數(shù)資料
| 型號(hào)： | S71GL064A80BFW0B2 |
| 廠商： | Spansion Inc. |
| 英文描述： | Stacked Multi-Chip Product (MCP) Flash Memory and RAM |
| 中文描述： | 堆疊式多芯片產(chǎn)品（MCP）的閃存和RAM |
| 文件頁(yè)數(shù)： | 66/102頁(yè) |
| 文件大?。?/td> | 1606K |
| 代理商： | S71GL064A80BFW0B2 |
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66
S71GL032A Based MCPs
S71GL032A_00_A0 March 31, 2005
A d v a n c e I n f o r m a t i o n
Test Conditions
Key to Switching Waveforms
Figure 12. Input Waveforms and Measurement Levels
Note:
Diodes are IN3064 or equivalent.
Figure 11. Test Setup
Table 24. Test Specifications
2.7 k
C
L
6.2 k
3.3 V
Device
Under
Test
Test Condition
All Speeds
Unit
Output Load
1 TTL gate
Output Load Capacitance, C
L
(including jig capacitance)
30
pF
Input Rise and Fall Times
5
ns
Input Pulse Levels
0.0 or V
CC
V
Input timing measurement
reference levels (See Note)
0.5 V
CC
V
Output timing measurement
reference levels
0.5 V
CC
V
W aveform
Inputs
Outputs
Steady
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
VCC
0.0 V
Output
Measurement Level
Input
0.5 VCC
0.5 VCC
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