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參數(shù)資料
| 型號： | S4406 |
| 廠商： | Applied Micro Circuits Corp. |
| 英文描述： | 12-Output BiCMOS PLL Clock Generator(能產(chǎn)生12個時鐘輸出的BiCMOS鎖相環(huán)時鐘發(fā)生器) |
| 中文描述： | 12路輸出的BiCMOS PLL時鐘發(fā)生器（能產(chǎn)生12個時鐘輸出的BiCMOS工藝鎖相環(huán)時鐘發(fā)生器） |
| 文件頁數(shù)： | 5/8頁 |
| 文件大小： | 106K |
| 代理商： | S4406 |
Applied Micro Circuits Corporation
6195 Lusk Blvd., San Diego, CA 92121 (619) 450-9333
Page
5
ELECTRICAL CHARACTERISTICS/PACKAGING
S4406
Symbol
VIH2
Input HIGH Voltage
2.0
2.4
2.0
-25
V
Guaranteed input HIGH voltage for all inputs
VIL2
VIK
Input LOW Voltage
Input clamp diode voltage
0.8
V
-1.2
0.5
-0.8
V
V
V
μA
μA
Guaranteed input LOW voltage for all inputs
VCC = Min, IIN = -18 mA
II
Input HIGH Current at Max
1.0
mA
50
VCC = Max, VIN = VCC
IOS4
ICC
ICCT
Output short circuit current
-100
-200
mA
VCC = Max, VOUT = 0V
VCC = Max
CLOAD = 25 pF at 50 MHz
Static
70
mA
Total ICC (Dynamic and Static)
200
mA
IIH
Input HIGH Current
VCC = Min, VIN = 2.4V
VCC = Min, VIN = 0.5V
VOH
Output HIGH Voltage
VCC = Min
VOL
Output LOW Voltage
VCC = Min,
IIL
Input LOW Current
IOH = -12 mA3
IOH = -24 mA3
IOL = 24 mA3
Parameter
Min
Typ1
Max
Units
DC Test Conditions
4MS2,3MS2,1,0
Other
μA
μA
-50
-500
4MS2,3MS2,1,0
Other
DC CHARACTERISTICS
1. Typical limits are at 25
°
C, V
= 5.0V.
2. These input levels provide zero noise immunity and should only be tested in a static, noise-free environment.
3. I
/I
values indicated are for DC test correlation. Actual dynamic currents are significantly higher.
4. Maximum test duration one second.
Figure 6. 52–pin PQFP Package
All dimensions in mm.
BODY SIZE PLUS 3.2 MM FOOTPRINT
DIM
LTR
e
B
A
A1
A2
A3
D
D1
E
E1
L
TOL/
LEADS
TYP
TYP
MAX
±.10
±.10
±.10
±.25
±.10
±.25
±.10
±.15/.10
52
1.00
.35
2.45
.920
.920
2.00
17.20
14.00
17.20
14.00
.88
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