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S/UNI-JET Data Sheet
Released
Proprietary and Confidential to PMC-Sierra, Inc., and for its Customers’ Internal Use
Document ID: PMC-1990267, Issue 3
249
12 Test Features Description
The test mode registers, shown in Table 27, are used for production and board testing.
During production testing, the test mode registers are used to apply test vectors. In this case, the
test mode registers (as opposed to the normal mode registers) are selected when A[10] is high.
During board testing, the digital output pins and the data bus are held in a high-impedance state
by simultaneously asserting (low) the CSB, RDB, and WRB inputs. All of the TSBs for the
S/UNI-JET are placed in test mode 0 so that device inputs may be read and device outputs may be
forced through the microprocessor interface. Refer to the section "Test Mode 0" for details.
Note: The S/UNI-JET supports a standard IEEE 1149.1 five-signal JTAG boundary scan test port
that can be used for board testing. All digital device inputs may be read and all digital device
outputs may be forced through this JTAG test port.
Table 27 Test Mode Register Memory Map
Address
Register
000H-3FFH
Normal Mode Registers
400H
Master Test Register
708H
SPLR Test Register 0
709H
SPLR Test Register 1
70AH
SPLR Test Register 2
70BH
Reserved
70CH
SPLT Test Register 0
70DH
SPLT Test Register 1
70EH
SPLT Test Register 2
70FH
SPLT Test Register 3
710H
PMON Test Register 0
711H
PMON Test Register 1
712H-71FH
Reserved
720H
CPPM Test Register 0
721H
CPPM Test Register 1
722H
CPPM Test Register 2
723H-72FH
Reserved
730H
DS3 FRMR Test Register 0
731H
DS3 FRMR Test Register 1
732H
DS3 FRMR Test Register 2
733H
DS3 FRMR Test Register 3
734H
DS3 TRAN Test Register 0
735H
DS3 TRAN Test Register 1
736H
DS3 TRAN Test Register 2