參數(shù)資料
型號: PEB2445N
廠商: SIEMENS AG
英文描述: LTM4600 Evaluation Kit
中文描述: ?多點(diǎn)交換和會議股-衰減?
文件頁數(shù): 57/70頁
文件大?。?/td> 1236K
代理商: PEB2445N
PEB 2445
Electrical Characteristics
Semiconductor Group
57
02.96
5.2
T
A
= 25
°
C;
V
DD
= 5 V
±
5 %,
V
SS
= 0 V
Capacitances
5.3
Ambient temperature under bias range,
V
DD
= 5 V
±
5 %.
Inputs are driven to 2.4 V for a logical ‘1’ and to 0.4 V for a logical ‘0’.
Timing measurements are made at 2.0 V for a logical ‘1’ and at 0.8 V for a logical ‘0’.
The AC-testing input/output wave forms are shown below.
AC-Characteristics
Figure 21
I/O-Wave Form for AC-Test
5.3.1
Microprocessor Interface Timing
5.3.1.1 Intel Bus Mode
Figure 22
μ
P Read Cycle
Parameter
Symbol
Limit Values
Unit
min.
max.
10
15
20
Input capacitance
Output capacitance
C
IN
C
OUT
C
I/O
pF
pF
I/O
pF
Under
Test
Device
ITS05853
= 150 pF
C
L
2.4 V
0.4 V
Test Points
2.0 V
0.8 V
0.8 V
2.0 V
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