參數(shù)資料
型號(hào)： PA28F008SC-85
廠商： INTEL CORP
元件分類(lèi)： PROM
英文描述： BYTE-WIDE SmartVoltage FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT
中文描述： 1M X 8 FLASH 3.3V PROM, 85 ns, PDSO44
封裝： 13.30 X 28.20 MM, PLASTIC, SOP-44
文件頁(yè)數(shù)： 23/33頁(yè)
文件大?。?/td> 466K
代理商： PA28F008SC-85
28F008SA
AC INPUT/OUTPUT REFERENCE WAVEFORM
(1)
290429–11
AC test inputs are driven at V
OH
(2.4 V
TTL
) for a Logic ‘‘1’’ and V
OL
(0.45 V
TTL
) for a Logic
‘‘0’’. Input timing begins at V
IH
(2.0 V
TTL
) and V
IL
(0.8 V
TTL
). Output timing ends at V
IH
and
V
IL
. Input rise and fall times (10% to 90%)
k
10 ns.
AC TESTING LOAD CIRCUIT
(1)
C
L
e
100 pF
C
L
Includes Jig
Capacitance
R
L
e
3.3 k
X
290429–12
HIGH SPEED
AC INPUT/OUTPUT REFERENCE WAVEFORM
(2)
290429–17
AC test inputs are driven at 3.0V for a Logic ‘‘1’’ and 0.0V for a Logic ‘‘0’’. Input timing
begins, and output timing ends, at 1.5V. Input rise and fall times (10% to 90%)
k
10 ns.
HIGH SPEED
AC TESTING LOAD CIRCUIT
(2)
C
L
e
30 pF
C
L
Includes Jig
Capacitance
R
L
e
3.3 k
X
290429–18
NOTES:
1. Testing characteristics for 28F008SA-85 in Standard configuration, and 28F008SA-120.
2. Testing characteristics for 28F008SA-85 in High Speed configuration.
AC CHARACTERISTICSDRead-Only Operations
(1)
Versions
V
CC
g
5%
28F008SA-85
(4)
Unit
V
CC
g
10%
28F008SA-85
(5)
28F008SA-120
(5)
Symbol
Parameter
Notes
Min
Max
Min
Max
Min
Max
t
AVAV
t
RC
Read Cycle Time
85
90
120
ns
t
AVQV
t
ACC
Address to Output Delay
85
90
120
ns
t
ELQV
t
CE
CE
Y
to Output Delay
2
85
90
120
ns
t
PHQV
t
PWH
RP
Y
High to Output Delay
400
400
400
ns
t
GLQV
t
OE
OE
Y
to Output Delay
2
40
45
50
ns
t
ELQX
t
LZ
CE
Y
to Output Low Z
3
0
0
0
ns
t
EHQZ
t
HZ
CE
Y
High to Output High Z
3
55
55
55
ns
t
GLQX
t
OLZ
OE
Y
to Output Low Z
3
0
0
0
ns
t
GHQZ
t
DF
OE
Y
High to Output High Z
3
30
30
30
ns
t
OH
Output Hold from
Addresses, CE
Y
or OE
Y
Change, Whichever is First
3
0
0
0
ns
NOTES:
1. See AC Input/Output Reference Waveform for timing measurements.
2. OE
Y
may be delayed up to t
CE
–t
OE
after the falling edge of CE
Y
without impact on t
CE
.
3. Sampled, not 100% tested.
4. See High Speed AC Input/Output Reference Waveforms and High Speed AC Testing Load Circuits for testing characteris-
tics.
5. See AC Input/Output Reference Waveforms and AC Testing Load Circuits for testing characteristics.
23
相關(guān)PDF資料
PDF描述
PA28F008SA-120 8-MBIT (1-MBIT x 8) FlashFileTM MEMORY
PA28F008SC-120 BYTE-WIDE SmartVoltage FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT
PA34 POWER OPERATIONAL AMPLIFIERS
PA44 HIGH VOLTAGE POWER OPERATIONAL AMPLIFIER
PA7540JI-15 PA7540 PEEL Array? Programmable Electrically Erasable Logic Array
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
PA28F016S5-120 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SMART 5 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT
PA28F016S5-95 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SMART 5 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT
PA28F016SC-120 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SmartVoltage FlashFile⑩ MEMORY FAMILY 4, 8, AND 16 MBIT
PA28F016SC-95 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SmartVoltage FlashFile⑩ MEMORY FAMILY 4, 8, AND 16 MBIT
PA28F200B5B60 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:SMART 5 BOOT BLOCK FLASH MEMORY FAMILY 2, 4, 8 MBIT
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。

采購(gòu)需求

(若只采購(gòu)一條型號(hào)，填寫(xiě)一行即可)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

*型號(hào) *數(shù)量 廠商 批號(hào) 封裝
添加更多采購(gòu)

我的聯(lián)系方式

*
*
*