參數(shù)資料
型號: MTD2955V
廠商: FAIRCHILD SEMICONDUCTOR CORP
元件分類: JFETs
英文描述: P-Channel Enhancement Mode Field Effect Transistor
中文描述: 12 A, 60 V, 0.23 ohm, P-CHANNEL, Si, POWER, MOSFET, TO-252
封裝: DPAK-3
文件頁數(shù): 2/10頁
文件大小: 148K
代理商: MTD2955V
2
Motorola TMOS Power MOSFET Transistor Device Data
ELECTRICAL CHARACTERISTICS
(TJ = 25
°
C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage
(VGS = 0 Vdc, ID = 0.25 mAdc)
Temperature Coefficient (Positive)
(Cpk
2.0) (3)
V(BR)DSS
60
58
Vdc
mV/
°
C
Zero Gate Voltage Drain Current
(VDS = 60 Vdc, VGS = 0 Vdc)
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150
°
C)
Gate–Body Leakage Current (VGS =
±
15 Vdc, VDS = 0 Vdc)
IDSS
10
100
μ
Adc
IGSS
100
nAdc
ON CHARACTERISTICS (1)
Gate Threshold Voltage
(VDS = VGS, ID = 250
μ
Adc)
Threshold Temperature Coefficient (Negative)
(Cpk
2.0) (3)
VGS(th)
2.0
2.8
5.0
4.0
Vdc
mV/
°
C
Static Drain–to–Source On–Resistance
(VGS = 10 Vdc, ID = 6.0 Adc)
(Cpk
1.5) (3)
RDS(on)
0.185
0.230
Ohm
Drain–to–Source On–Voltage
(VGS = 10 Vdc, ID = 12 Adc)
(VGS = 10 Vdc, ID = 6.0 Adc, TJ = 150
°
C)
VDS(on)
2.9
2.5
Vdc
Forward Transconductance (VDS = 10 Vdc, ID = 6.0 Adc)
gFS
3.0
5.0
mhos
DYNAMIC CHARACTERISTICS
Input Capacitance
(VDS = 25 Vdc, VGS = 0 Vdc,
f = 1.0 MHz)
25 Vdc V
Ciss
Coss
550
770
pF
Output Capacitance
200
280
Reverse Transfer Capacitance
Crss
50
100
SWITCHING CHARACTERISTICS (2)
Turn–On Delay Time
(VDD = 30 Vd
VGS= 10 Vdc
VGS = 10 Vdc,
RG = 9.1
I
12 Ad
td(on)
tr
td(off)
tf
QT
Q1
Q2
Q3
15
30
ns
Rise Time
50
100
Turn–Off Delay Time
24
50
Fall Time
)
39
80
Gate Charge
(VDS = 48 Vdc,D
(DS
VGS = 10 Vdc)
19
30
nC
4.0
,
9.0
7.0
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (1)
(IS = 12 Adc, VGS = 0 Vdc)
(IS = 12 Adc, VGS = 0 Vdc, TJ = 150
°
C)
VSD
1.8
1.5
3.0
Vdc
Reverse Recovery Time
(IS = 12 Adc, VGS
(S
dIS/dt = 100 A/
μ
s)
trr
ta
tb
115
ns
90
,
25
Reverse Recovery Stored Charge
QRR
0.53
μ
C
INTERNAL PACKAGE INDUCTANCE
Internal Drain Inductance
(Measured from contact screw on tab to center of die)
(Measured from the drain lead 0.25
from package to center of die)
LD
3.5
4.5
nH
Internal Source Inductance
(Measured from the source lead 0.25
from package to source bond pad)
LS
7.5
nH
(1) Pulse Test: Pulse Width
300
μ
s, Duty Cycle
2%.
(2) Switching characteristics are independent of operating junction temperature.
(3) Reflects typical values. Cpk =
3 x SIGMA
Max limit – Typ
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